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Palasantzas, G., De Hosson, J. Th. M. (2001) Erratum: Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode [Phys. Rev. B63, 125404 (2001)]. Physical Review B, 63 (23) doi:10.1103/physrevb.63.239901

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Reference TypeJournal (article/letter/editorial)
TitleErratum: Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode [Phys. Rev. B63, 125404 (2001)]
JournalPhysical Review B
AuthorsPalasantzas, G.Author
De Hosson, J. Th. M.Author
Year2001 (May 29)Volume63
Issue23
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.239901Search in ResearchGate
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Mindat Ref. ID14157042Long-form Identifiermindat:1:5:14157042:8
GUID0
Full ReferencePalasantzas, G., De Hosson, J. Th. M. (2001) Erratum: Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode [Phys. Rev. B63, 125404 (2001)]. Physical Review B, 63 (23) doi:10.1103/physrevb.63.239901
Plain TextPalasantzas, G., De Hosson, J. Th. M. (2001) Erratum: Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode [Phys. Rev. B63, 125404 (2001)]. Physical Review B, 63 (23) doi:10.1103/physrevb.63.239901
In(2001, May) Physical Review B Vol. 63 (23) American Physical Society (APS)

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Palasantzas, G., De Hosson, J. Th. M. (2001) Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode. Physical Review B, 63 (12) doi:10.1103/physrevb.63.125404
Palasantzas, G., Zhao, Y.-P., Wang, G.-C., Lu, T.-M., Barnas, J., De Hosson, J. Th. M. (2001) Erratum: Electrical conductivity and thin film growth dynamics [Phys. Rev. B61, 11 109 (2000)]. Physical Review B, 64 (7) doi:10.1103/physrevb.64.079903
Palasantzas, G., BarnaÅ›, J., De Hosson, J. Th. M. (2001) Correlated roughness effects on electrical conductivity of quantum wires. Journal of Applied Physics, 89 (12). 8002-8005 doi:10.1063/1.1372656
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Zhao, Y.-P., Palasantzas, G., Wang, G.-C., De Hosson, J. Th. M. (1999) Surface/interface-roughness-induced demagnetizing effect in thin magnetic films. Physical Review B, 60 (2) 1216-1226 doi:10.1103/physrevb.60.1216
Mori, A., Naka, N., Nagasawa, N. (2001) Erratum: Effects of Rayleigh scattering on photovoltaic spectra associated with1sorthoexcitons inCu2O[Phys. Rev. B63, 033202 (2001)]. Physical Review B, 63 (16) doi:10.1103/physrevb.63.169901
Palasantzas, G., Zhao, Y.-P., Wang, G.-C., Lu, T.-M., Barnas, J., De Hosson, J. Th. M. (2000) Electrical conductivity and thin-film growth dynamics. Physical Review B, 61 (16) 11109-11117 doi:10.1103/physrevb.61.11109
Oguri, Akira (2001) Erratum: Quasiparticle description for transport through a small interacting system [Phys. Rev. B63, 115305 (2001)]. Physical Review B, 63 (24) doi:10.1103/physrevb.63.249901
Palasantzas, G., De Hosson, J. Th. M. (2003) Influence of surface roughness on the adhesion of elastic films. Physical Review E, 67 (2) doi:10.1103/physreve.67.021604
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Palasantzas, G., De Hosson, J. Th. M. (2004) Influence of self-affine roughness on the detachment stress at an elastic-inelastic interface. Physical Review B, 69 (15) doi:10.1103/physrevb.69.155408
 
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