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Ke, S. H., Uda, T., Štich, I., Terakura, K. (2001) First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology. Physical Review B, 63 (24) doi:10.1103/physrevb.63.245323

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Reference TypeJournal (article/letter/editorial)
TitleFirst-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology
JournalPhysical Review B
AuthorsKe, S. H.Author
Uda, T.Author
Štich, I.Author
Terakura, K.Author
Year2001 (June 7)Volume63
Issue24
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.245323Search in ResearchGate
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Mindat Ref. ID14157105Long-form Identifiermindat:1:5:14157105:0
GUID0
Full ReferenceKe, S. H., Uda, T., Štich, I., Terakura, K. (2001) First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology. Physical Review B, 63 (24) doi:10.1103/physrevb.63.245323
Plain TextKe, S. H., Uda, T., Štich, I., Terakura, K. (2001) First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology. Physical Review B, 63 (24) doi:10.1103/physrevb.63.245323
In(2001, May) Physical Review B Vol. 63 (24) American Physical Society (APS)

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Tóbik, J., Štich, I., Terakura, K. (2001) Effect of tip morphology on image formation in noncontact atomic force microscopy: InP(110) Physical Review B, 63 (24) doi:10.1103/physrevb.63.245324
Ke, S. H., Uda, T., Pérez, R., Štich, I., Terakura, K. (1999) First-principles investigation of tip-surface interaction on a GaAs(110) surface: Implications for atomic force and scanning tunneling microscopies. Physical Review B, 60 (16) 11631-11638 doi:10.1103/physrevb.60.11631
Ke, S. H., Uda, T., Terakura, K. (2002) First-principles studies of tip-sample interaction and STM-AFM image formation onTiO2(110)−1×1andTiO2(110)−1×2surfaces. Physical Review B, 65 (12) doi:10.1103/physrevb.65.125417
Ke, S.H., Uda, T., Štich, I., Terakura, K. (2001) Effect of tip morphology on AFM images. Applied Physics A, 72. doi:10.1007/s003390100639
Tóbik, J., Štich, I., Pérez, R., Terakura, K. (1999) Simulation of tip-surface interactions in atomic force microscopy of an InP(110) surface with a Si tip. Physical Review B, 60 (16) 11639-11644 doi:10.1103/physrevb.60.11639
Ke, S. H., Uda, T., Terakura, K. (1999) Quantity measured in frequency-shift-mode atomic-force microscopy: An analysis with a numerical model. Physical Review B, 59 (20) 13267-13272 doi:10.1103/physrevb.59.13267
Pérez, Rubén, Štich, Ivan, Payne, Michael C., Terakura, Kiyoyuki (1998) Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111) Physical Review B, 58 (16) 10835-10849 doi:10.1103/physrevb.58.10835
Konôpka, M., Štich, I., Terakura, K. (2002) Structure and dynamics of atomic hydrogen on NiAl(110) Physical Review B, 65 (12) doi:10.1103/physrevb.65.125418
Ke, S. H., Uda, T., Terakura, K. (2000) Surface topography of theSi(111)−7×7reconstruction. Physical Review B, 62 (23) 15319-15322 doi:10.1103/physrevb.62.15319
Pérez, Rubén, Payne, Michael C., Štich, Ivan, Terakura, Kiyoyuki (1997) Role of Covalent Tip-Surface Interactions in Noncontact Atomic Force Microscopy on Reactive Surfaces. Physical Review Letters, 78 (4). 678-681 doi:10.1103/physrevlett.78.678
Bamidele, J., Kinoshita, Y., Turanský, R., Lee, S. H., Naitoh, Y., Li, Y. J., Sugawara, Y., Štich, I., Kantorovich, L. (2014) Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces. Physical Review B, 90 (3) doi:10.1103/physrevb.90.035410
 
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