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Foster, A. S., Gal, A. Y., Airaksinen, J. M., Pakarinen, O. H., Lee, Y. J., Gale, J. D., Shluger, A. L., Nieminen, R. M. (2003) Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips. Physical Review B, 68 (19) doi:10.1103/physrevb.68.195420

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Reference TypeJournal (article/letter/editorial)
TitleTowards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips
JournalPhysical Review B
AuthorsFoster, A. S.Author
Gal, A. Y.Author
Airaksinen, J. M.Author
Pakarinen, O. H.Author
Lee, Y. J.Author
Gale, J. D.Author
Shluger, A. L.Author
Nieminen, R. M.Author
Year2003 (November 24)Volume68
Issue19
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.68.195420Search in ResearchGate
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Mindat Ref. ID14169395Long-form Identifiermindat:1:5:14169395:0
GUID0
Full ReferenceFoster, A. S., Gal, A. Y., Airaksinen, J. M., Pakarinen, O. H., Lee, Y. J., Gale, J. D., Shluger, A. L., Nieminen, R. M. (2003) Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips. Physical Review B, 68 (19) doi:10.1103/physrevb.68.195420
Plain TextFoster, A. S., Gal, A. Y., Airaksinen, J. M., Pakarinen, O. H., Lee, Y. J., Gale, J. D., Shluger, A. L., Nieminen, R. M. (2003) Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips. Physical Review B, 68 (19) doi:10.1103/physrevb.68.195420
In(2003, November) Physical Review B Vol. 68 (19) American Physical Society (APS)

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Foster, A. S., Pakarinen, O. H., Airaksinen, J. M., Gale, J. D., Nieminen, R. M. (2003) Simulating atomic force microscopy imaging of the ideal and defectedTiO2(110) surface. Physical Review B, 68 (19) doi:10.1103/physrevb.68.195410
Foster, A. S., Gal, A. Y., Gale, J. D., Lee, Y. J., Nieminen, R. M., Shluger, A. L. (2004) Interaction of Silicon Dangling Bonds with Insulating Surfaces. Physical Review Letters, 92 (3). doi:10.1103/physrevlett.92.036101
Foster, A. S., Gal, A. Y., Nieminen, R. M., Shluger, A. L. (2005) Probing Organic Layers on the TiO2(110) Surface. The Journal of Physical Chemistry B, 109 (10). 4554-4560 doi:10.1021/jp045562+
Pakarinen, O. H., Barth, C., Foster, A. S., Nieminen, R. M., Henry, C. R. (2006) High-resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface. Physical Review B, 73 (23) doi:10.1103/physrevb.73.235428
Foster, A. S., Lopez Gejo, F., Shluger, A. L., Nieminen, R. M. (2002) Vacancy and interstitial defects in hafnia. Physical Review B, 65 (17) doi:10.1103/physrevb.65.174117
Bamidele, J., Kinoshita, Y., Turanský, R., Lee, S. H., Naitoh, Y., Li, Y. J., Sugawara, Y., Štich, I., Kantorovich, L. (2014) Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces. Physical Review B, 90 (3) doi:10.1103/physrevb.90.035410
Lee, Y. J., Pesola, M., von Boehm, J., Nieminen, R. M. (2002) Local vibrations of thermal double donors in silicon. Physical Review B, 66 (7) doi:10.1103/physrevb.66.075219
Foster, Adam S., Barth, Clemens, Shluger, Alexander L., Nieminen, Risto M., Reichling, Michael (2002) Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy:CaF2(111)as a reference surface. Physical Review B, 66 (23) doi:10.1103/physrevb.66.235417
Piscanec, S., Cantoro, M., Ferrari, A. C., Zapien, J. A., Lifshitz, Y., Lee, S. T., Hofmann, S., Robertson, J. (2003) Raman spectroscopy of silicon nanowires. Physical Review B, 68 (24) doi:10.1103/physrevb.68.241312
Lee, Y. J., Brandbyge, M., Puska, M. J., Taylor, J., Stokbro, K., Nieminen, R. M. (2004) Electron transport through monovalent atomic wires. Physical Review B, 69 (12) doi:10.1103/physrevb.69.125409
Foster, A. S., Sulimov, V. B., Lopez Gejo, F., Shluger, A. L., Nieminen, R. M. (2001) Structure and electrical levels of point defects in monoclinic zirconia. Physical Review B, 64 (22) doi:10.1103/physrevb.64.224108
 
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