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Zheng, Fan, McChesney, J. L., Liu, Xiaosong, Himpsel, F. J. (2006) Orientation of fluorophenols on Si(111) by near edge x-ray absorption fine structure spectroscopy. Physical Review B, 73 (20) doi:10.1103/physrevb.73.205315

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Reference TypeJournal (article/letter/editorial)
TitleOrientation of fluorophenols on Si(111) by near edge x-ray absorption fine structure spectroscopy
JournalPhysical Review B
AuthorsZheng, FanAuthor
McChesney, J. L.Author
Liu, XiaosongAuthor
Himpsel, F. J.Author
Year2006 (May 9)Volume73
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.73.205315Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14183780Long-form Identifiermindat:1:5:14183780:4
GUID0
Full ReferenceZheng, Fan, McChesney, J. L., Liu, Xiaosong, Himpsel, F. J. (2006) Orientation of fluorophenols on Si(111) by near edge x-ray absorption fine structure spectroscopy. Physical Review B, 73 (20) doi:10.1103/physrevb.73.205315
Plain TextZheng, Fan, McChesney, J. L., Liu, Xiaosong, Himpsel, F. J. (2006) Orientation of fluorophenols on Si(111) by near edge x-ray absorption fine structure spectroscopy. Physical Review B, 73 (20) doi:10.1103/physrevb.73.205315
In(2006, May) Physical Review B Vol. 73 (20) American Physical Society (APS)


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