Park, J. M., Lynch, D. W., Lee, S. J., Schlagel, D. L., Lograsso, T. A., Tsokol, A. O., Snyder, J. E., Jiles, D. C. (2006) Spectroscopic ellipsometry study of optical anisotropy inGd5Si2Ge2and comparison with reflectance difference spectra. Physical Review B, 73 (3) doi:10.1103/physrevb.73.035110
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Spectroscopic ellipsometry study of optical anisotropy inGd5Si2Ge2and comparison with reflectance difference spectra | ||
Journal | Physical Review B | ||
Authors | Park, J. M. | Author | |
Lynch, D. W. | Author | ||
Lee, S. J. | Author | ||
Schlagel, D. L. | Author | ||
Lograsso, T. A. | Author | ||
Tsokol, A. O. | Author | ||
Snyder, J. E. | Author | ||
Jiles, D. C. | Author | ||
Year | 2006 (January 9) | Volume | 73 |
Issue | 3 | ||
Publisher | American Physical Society (APS) | ||
DOI | doi:10.1103/physrevb.73.035110Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14184460 | Long-form Identifier | mindat:1:5:14184460:4 |
GUID | 0 | ||
Full Reference | Park, J. M., Lynch, D. W., Lee, S. J., Schlagel, D. L., Lograsso, T. A., Tsokol, A. O., Snyder, J. E., Jiles, D. C. (2006) Spectroscopic ellipsometry study of optical anisotropy inGd5Si2Ge2and comparison with reflectance difference spectra. Physical Review B, 73 (3) doi:10.1103/physrevb.73.035110 | ||
Plain Text | Park, J. M., Lynch, D. W., Lee, S. J., Schlagel, D. L., Lograsso, T. A., Tsokol, A. O., Snyder, J. E., Jiles, D. C. (2006) Spectroscopic ellipsometry study of optical anisotropy inGd5Si2Ge2and comparison with reflectance difference spectra. Physical Review B, 73 (3) doi:10.1103/physrevb.73.035110 | ||
In | (2006, January) Physical Review B Vol. 73 (3) American Physical Society (APS) |
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