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Xia, Jing, Siemons, W., Koster, G., Beasley, M. R., Kapitulnik, A. (2009) Critical thickness for itinerant ferromagnetism in ultrathin films ofSrRuO3. Physical Review B, 79 (14) doi:10.1103/physrevb.79.140407

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Reference TypeJournal (article/letter/editorial)
TitleCritical thickness for itinerant ferromagnetism in ultrathin films ofSrRuO3
JournalPhysical Review B
AuthorsXia, JingAuthor
Siemons, W.Author
Koster, G.Author
Beasley, M. R.Author
Kapitulnik, A.Author
Year2009 (April 16)Volume79
Issue14
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.79.140407Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14200725Long-form Identifiermindat:1:5:14200725:1
GUID0
Full ReferenceXia, Jing, Siemons, W., Koster, G., Beasley, M. R., Kapitulnik, A. (2009) Critical thickness for itinerant ferromagnetism in ultrathin films ofSrRuO3. Physical Review B, 79 (14) doi:10.1103/physrevb.79.140407
Plain TextXia, Jing, Siemons, W., Koster, G., Beasley, M. R., Kapitulnik, A. (2009) Critical thickness for itinerant ferromagnetism in ultrathin films ofSrRuO3. Physical Review B, 79 (14) doi:10.1103/physrevb.79.140407
In(2009, April) Physical Review B Vol. 79 (14) American Physical Society (APS)

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