Reference Type | Journal (article/letter/editorial) |
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Title | Amorphous to crystalline phase transition: Onset of pattern formation during ion erosion of Si(001) |
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Journal | Physical Review B |
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Authors | Engler, Martin | Author |
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Michely, Thomas | Author |
Year | 2016 (February 16) | Volume | 93 |
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Issue | 8 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrevb.93.085423Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14242023 | Long-form Identifier | mindat:1:5:14242023:4 |
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GUID | 0 |
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Full Reference | Engler, Martin, Michely, Thomas (2016) Amorphous to crystalline phase transition: Onset of pattern formation during ion erosion of Si(001) Physical Review B, 93 (8) doi:10.1103/physrevb.93.085423 |
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Plain Text | Engler, Martin, Michely, Thomas (2016) Amorphous to crystalline phase transition: Onset of pattern formation during ion erosion of Si(001) Physical Review B, 93 (8) doi:10.1103/physrevb.93.085423 |
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In | (2016, February) Physical Review B Vol. 93 (8) American Physical Society (APS) |
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