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Müglich, Nicolas David, Gaul, Alexander, Meyl, Markus, Ehresmann, Arno, Götz, Gerhard, Reiss, Günter, Kuschel, Timo (2016) Time-dependent rotatable magnetic anisotropy in polycrystalline exchange-bias systems: Dependence on grain-size distribution. Physical Review B, 94 (18) doi:10.1103/physrevb.94.184407

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Reference TypeJournal (article/letter/editorial)
TitleTime-dependent rotatable magnetic anisotropy in polycrystalline exchange-bias systems: Dependence on grain-size distribution
JournalPhysical Review B
AuthorsMüglich, Nicolas DavidAuthor
Gaul, AlexanderAuthor
Meyl, MarkusAuthor
Ehresmann, ArnoAuthor
Götz, GerhardAuthor
Reiss, GünterAuthor
Kuschel, TimoAuthor
Year2016 (November 9)Volume94
Issue18
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.94.184407Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14243257Long-form Identifiermindat:1:5:14243257:2
GUID0
Full ReferenceMüglich, Nicolas David, Gaul, Alexander, Meyl, Markus, Ehresmann, Arno, Götz, Gerhard, Reiss, Günter, Kuschel, Timo (2016) Time-dependent rotatable magnetic anisotropy in polycrystalline exchange-bias systems: Dependence on grain-size distribution. Physical Review B, 94 (18) doi:10.1103/physrevb.94.184407
Plain TextMüglich, Nicolas David, Gaul, Alexander, Meyl, Markus, Ehresmann, Arno, Götz, Gerhard, Reiss, Günter, Kuschel, Timo (2016) Time-dependent rotatable magnetic anisotropy in polycrystalline exchange-bias systems: Dependence on grain-size distribution. Physical Review B, 94 (18) doi:10.1103/physrevb.94.184407
In(2016, November) Physical Review B Vol. 94 (18) American Physical Society (APS)

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Gaul, Alexander, Hankemeier, Sebastian, Holzinger, Dennis, Müglich, Nicolas David, Staeck, Philipp, Frömter, Robert, Oepen, Hans Peter, Ehresmann, Arno (2016) Engineered magnetic domain textures in exchange bias bilayer systems. Journal of Applied Physics, 120 (3). 33902pp. doi:10.1063/1.4958847
Meyl, Markus, Ehresmann, Arno (2020) Influence of the antiferromagnetic grain volume distribution on exchange-bias in polycrystalline thin films: An X-ray diffractometry study. Journal of Magnetism and Magnetic Materials, 495. 165859pp. doi:10.1016/j.jmmm.2019.165859
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