Reference Type | Journal (article/letter/editorial) |
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Title | Noisy classical field theories with two coupled fields: Dependence of escape rates on relative field stiffness |
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Journal | Physical Review E |
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Authors | Gong, Lan | Author |
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Stein, D. L. | Author |
Year | 2011 (September 16) | Volume | 84 |
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Issue | 3 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physreve.84.031119Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14510846 | Long-form Identifier | mindat:1:5:14510846:7 |
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GUID | 0 |
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Full Reference | Gong, Lan, Stein, D. L. (2011) Noisy classical field theories with two coupled fields: Dependence of escape rates on relative field stiffness. Physical Review E, 84 (3) doi:10.1103/physreve.84.031119 |
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Plain Text | Gong, Lan, Stein, D. L. (2011) Noisy classical field theories with two coupled fields: Dependence of escape rates on relative field stiffness. Physical Review E, 84 (3) doi:10.1103/physreve.84.031119 |
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In | (2011, September) Physical Review E Vol. 84 (3) American Physical Society (APS) |
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