| Reference Type | Journal (article/letter/editorial) |
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| Title | High-resolution silicon Kβ X-ray spectra and crystal structure |
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| Journal | Mineralogical Magazine | ISSN | 0026-461X |
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| Authors | Purton, J. | Author |
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| Urch, D. S. | Author |
| Year | 1989 (April) | Volume | 53 |
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| Issue | 370 |
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| Publisher | Mineralogical Society |
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| Download URL | https://rruff.info/doclib/MinMag/Volume_53/53-370-239.pdf+ |
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| DOI | doi:10.1180/minmag.1989.053.370.11Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 1497 | Long-form Identifier | mindat:1:5:1497:1 |
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| GUID | 0 |
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| Full Reference | Purton, J., Urch, D. S. (1989) High-resolution silicon Kβ X-ray spectra and crystal structure. Mineralogical Magazine, 53 (370) 239-244 doi:10.1180/minmag.1989.053.370.11 |
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| Plain Text | Purton, J., Urch, D. S. (1989) High-resolution silicon Kβ X-ray spectra and crystal structure. Mineralogical Magazine, 53 (370) 239-244 doi:10.1180/minmag.1989.053.370.11 |
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| In | (1989, April) Mineralogical Magazine Vol. 53 (370) Mineralogical Society |
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| Abstract/Notes | AbstractHigh-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO44--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kβ spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si-Kβ peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established. |
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