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Hosoya, Sukeaki, Yamagishi, Tomoe (1967) Influence of Line Profile on Counting Loss Correction. Japanese Journal of Applied Physics, 6 (11) 1263-1264 doi:10.1143/jjap.6.1263

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Reference TypeJournal (article/letter/editorial)
TitleInfluence of Line Profile on Counting Loss Correction
JournalJapanese Journal of Applied Physics
AuthorsHosoya, SukeakiAuthor
Yamagishi, TomoeAuthor
Year1967 (November)Volume6
Issue11
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.6.1263Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14976721Long-form Identifiermindat:1:5:14976721:9
GUID0
Full ReferenceHosoya, Sukeaki, Yamagishi, Tomoe (1967) Influence of Line Profile on Counting Loss Correction. Japanese Journal of Applied Physics, 6 (11) 1263-1264 doi:10.1143/jjap.6.1263
Plain TextHosoya, Sukeaki, Yamagishi, Tomoe (1967) Influence of Line Profile on Counting Loss Correction. Japanese Journal of Applied Physics, 6 (11) 1263-1264 doi:10.1143/jjap.6.1263
In(1967, November) Japanese Journal of Applied Physics Vol. 6 (11) Japan Society of Applied Physics

See Also

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Namikawa, Kazumichi, Hosoya, Sukeaki (1982) On the Sensitivity of the Fluorescence EXAFS. Japanese Journal of Applied Physics, 21. doi:10.1143/jjap.21.l687
Wakoh, Shinya, Fukamachi, Tomoe, Hosoya, Sukeaki, Yamashita, Jiro (1975) Compton Profile of Niobium. Journal of the Physical Society of Japan, 38 (6). 1601-1606 doi:10.1143/jpsj.38.1601
Hosoya, Sukeaki, Yamagishi, Tomoe (1966) Absolute Measurement of X-Ray Scattering Factors of Copper. Journal of the Physical Society of Japan, 21 (12). 2638-2644 doi:10.1143/jpsj.21.2638
Tsuchiya, Yoshimi, Noguchi, Seiichiro, Fukamachi, Tomoe, Hosoya, Sukeaki (1975) Compton Profile of Ultra-Fine Particles of Copper. Journal of the Physical Society of Japan, 39 (6). 1586-1589 doi:10.1143/jpsj.39.1586
Hosoya, Sukeaki (1968) The Kα2Radiation Monochromated by a New Filter and Its Topographical and Other Applications. Japanese Journal of Applied Physics, 7 (1) 1-6 doi:10.1143/jjap.7.1
Hosoya, Sukeaki (1968) The Kα2Radiation Monochromated by a New Filter and Its Topographical and Other Applications. Japanese Journal of Applied Physics, 7 (7) 794 doi:10.1143/jjap.7.794
Hosoya, Sukeaki, Yamagishi, Tomoe, Tokonami, Masayasu (1968) Study of Electron State in Vanadium Nitride by Intensity Measurements of X-Ray Diffraction. Journal of the Physical Society of Japan, 24 (2). 363-367 doi:10.1143/jpsj.24.363
Hosoya, Sukeaki, Satake, Seiya (1965) The Absorption Factor of a Pressed Powder Sample with Varying Density in Depth. Japanese Journal of Applied Physics, 4 (4) 313 doi:10.1143/jjap.4.313
Hosoya, Sukeaki (1968) An Error in the Absorption Factor due to Beam Divergence of Incident X-Rays onto a Flat Specimen. Japanese Journal of Applied Physics, 7 (8) 962-963 doi:10.1143/jjap.7.962
Ficker, Tomáš, Šikula, Josef (1984) Spark and Glow DC-Partial-Discharges in Dielectrics. Japanese Journal of Applied Physics, 23. 1263-1264 doi:10.1143/jjap.23.1263
Fukamachi, Tomoe, Hosoya, Sukeaki (1971) Electron State of an O-2Atom in MgO. Journal of the Physical Society of Japan, 31 (4). 980-989 doi:10.1143/jpsj.31.980
 
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