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Ōki, Shigeru, Futagami, Kōji (1969) X-Ray Diffraction Topography by a Scanning Soller Slit Assembly. Japanese Journal of Applied Physics, 8 (12) 1574-1575 doi:10.1143/jjap.8.1574

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Diffraction Topography by a Scanning Soller Slit Assembly
JournalJapanese Journal of Applied Physics
AuthorsŌki, ShigeruAuthor
Futagami, KōjiAuthor
Year1969 (December)Volume8
Issue12
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.8.1574Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14977513Long-form Identifiermindat:1:5:14977513:9
GUID0
Full ReferenceŌki, Shigeru, Futagami, Kōji (1969) X-Ray Diffraction Topography by a Scanning Soller Slit Assembly. Japanese Journal of Applied Physics, 8 (12) 1574-1575 doi:10.1143/jjap.8.1574
Plain TextŌki, Shigeru, Futagami, Kōji (1969) X-Ray Diffraction Topography by a Scanning Soller Slit Assembly. Japanese Journal of Applied Physics, 8 (12) 1574-1575 doi:10.1143/jjap.8.1574
In(1969, December) Japanese Journal of Applied Physics Vol. 8 (12) Japan Society of Applied Physics

See Also

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Ōki, Sigeru, Futagami, Kōji (1974) Mechanical Behavior of Dislocations in Si Single Crystals Observed by Topography with Scanning Soller Slit Assembly. Japanese Journal of Applied Physics, 13 (4) 605-610 doi:10.1143/jjap.13.605
Akashi, Yodhiyo, Futagami, Kōji, Ōki, Shigeru (1979) X-Ray Diffraction Contrast at Twin Boundaries. Japanese Journal of Applied Physics, 18 (1) 15-17 doi:10.1143/jjap.18.15
Ōki, Shigeru, Futagami, Kōji, Agashi, Yoshito (1978) X-Ray Topographic Study of Defects in ADP Single Crystal. Japanese Journal of Applied Physics, 17 (1) 23-31 doi:10.1143/jjap.17.23
Futagami, Kōji (1967) X-Ray Studies on the Sub-Grain Boundaries of LiF Single Crystals by the Limited Projection Topography. Japanese Journal of Applied Physics, 6 (12) 1381-1392 doi:10.1143/jjap.6.1381
Futagami, Kōji (1971) Parallel Dislocation Images on the X-Ray Diffraction Topograph in Iron Single Crystals. Japanese Journal of Applied Physics, 10 (6) 814-815 doi:10.1143/jjap.10.814
Futagami, Koji (1963) Diffraction Topography of the X-ray Diffraction Spikes of Diamond. Japanese Journal of Applied Physics, 2 (7) 433-434 doi:10.1143/jjap.2.433
Futagami, Kōji, Akashi, Yoshito (1972) Pseudo-Kossel Patterns Obtained by Fluorescent X-Rays. Japanese Journal of Applied Physics, 11 (10) 1586-1587 doi:10.1143/jjap.11.1586
Fukumori, Taichiro, Futagami, Kōji, Matsunaga, Kuniyoshi (1982) X-Ray Double-Crystal Method for Crystal Lattice Parameter Measurements Using Cu Kα Doublet. Japanese Journal of Applied Physics, 21. 1525 doi:10.1143/jjap.21.1525
Miyajima, Hideki, Futagami, Kunio, Mizoguchi, Tadashi (1973) Signal Averaging Techniques for X-Ray Diffraction Spectroscopy. Japanese Journal of Applied Physics, 12 (9) 1469-1470 doi:10.1143/jjap.12.1469
Fukumori, Taichiro, Futagami, Koji, Kuroki, Kiyohiro (2004) Measurements of Minute Lattice Distortions in Silicon Crystals by X-Ray Double-Crystal Topography Using Extremely Asymmetric Reflection. Japanese Journal of Applied Physics, 43 (12) 8331-8334 doi:10.1143/jjap.43.8331
Fukumori, Taichiro, Futagami, Kōji (1988) Measurements of Lattice Parameters and Half-Widths of the Rocking Curve on GaAs Crystal by the X-Ray Double-Crystal Method Using a Cu KαDoublet. Japanese Journal of Applied Physics, 27. 442-443 doi:10.1143/jjap.27.442
 
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