Iijima, Yoshio (1970) Electron Probe X-Ray Micro-Analysis on Impurities in Evaporated BaTiO3Films. Japanese Journal of Applied Physics, 9 (7) 852-853 doi:10.1143/jjap.9.852
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electron Probe X-Ray Micro-Analysis on Impurities in Evaporated BaTiO3Films | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Iijima, Yoshio | Author | |
Year | 1970 (July) | Volume | 9 |
Issue | 7 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.9.852Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14978052 | Long-form Identifier | mindat:1:5:14978052:2 |
GUID | 0 | ||
Full Reference | Iijima, Yoshio (1970) Electron Probe X-Ray Micro-Analysis on Impurities in Evaporated BaTiO3Films. Japanese Journal of Applied Physics, 9 (7) 852-853 doi:10.1143/jjap.9.852 | ||
Plain Text | Iijima, Yoshio (1970) Electron Probe X-Ray Micro-Analysis on Impurities in Evaporated BaTiO3Films. Japanese Journal of Applied Physics, 9 (7) 852-853 doi:10.1143/jjap.9.852 | ||
In | (1970, July) Japanese Journal of Applied Physics Vol. 9 (7) Japan Society of Applied Physics |
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