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Tajima, Michio, Nomura, Masayoshi (1981) Photoluminescence Analysis of Impurities in Epitaxial Silicon Crystals. Japanese Journal of Applied Physics, 20 (10) doi:10.1143/jjap.20.l697

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Reference TypeJournal (article/letter/editorial)
TitlePhotoluminescence Analysis of Impurities in Epitaxial Silicon Crystals
JournalJapanese Journal of Applied Physics
AuthorsTajima, MichioAuthor
Nomura, MasayoshiAuthor
Year1981 (October)Volume20
Issue10
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.20.l697Search in ResearchGate
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Mindat Ref. ID14984652Long-form Identifiermindat:1:5:14984652:5
GUID0
Full ReferenceTajima, Michio, Nomura, Masayoshi (1981) Photoluminescence Analysis of Impurities in Epitaxial Silicon Crystals. Japanese Journal of Applied Physics, 20 (10) doi:10.1143/jjap.20.l697
Plain TextTajima, Michio, Nomura, Masayoshi (1981) Photoluminescence Analysis of Impurities in Epitaxial Silicon Crystals. Japanese Journal of Applied Physics, 20 (10) doi:10.1143/jjap.20.l697
In(1981, October) Japanese Journal of Applied Physics Vol. 20 (10) Japan Society of Applied Physics

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Tajima, Michio, Masui, Tsumoru, Abe, Takao, Nozaki, Tadashi (1981) Photoluminescence Associated with Nitrogen in Silicon. Japanese Journal of Applied Physics, 20 (6) doi:10.1143/jjap.20.l423
Tajima, Michio (1977) Photoluminescence Analyses of Shallow Impurities in Silicon. Japanese Journal of Applied Physics, 16 (12) 2263-2264 doi:10.1143/jjap.16.2263
Tajima, Michio, Kishino, Seigo, Iizuka, Takashi (1979) Photoluminescence Analysis of Annealed Silicon Crystals. Japanese Journal of Applied Physics, 18 (7) 1403-1404 doi:10.1143/jjap.18.1403
Tajima, Michio (1977) Correlation between Photoluminescence Spectra and Impurity Concentrations in Silicon. Japanese Journal of Applied Physics, 16 (12) 2265-2266 doi:10.1143/jjap.16.2265
Tajima, Michio, Matsushita, Yoshiaki (1983) Photoluminescence Related to Dislocations in Annealed Czochralski-Grown Si Crystals. Japanese Journal of Applied Physics, 22. doi:10.1143/jjap.22.l589
Tajima, Michio, Kanamori, Akihiro, Iizuka, Takashi (1979) Photoluminescence Spectra of Thermal Donors in Silicon. Japanese Journal of Applied Physics, 18 (7) 1401-1402 doi:10.1143/jjap.18.1401
Warashina, Masatoshi, Tajima, Michio (1996) Spectral Shape Analysis of Photoluminescence Excitation in Semiconductors. Japanese Journal of Applied Physics, 35. 120-123 doi:10.1143/jjap.35.120
Ibuka, Shigeo, Tajima, Michio (2000) Characterization of Silicon-on-Insulator Wafers by Photoluminescence Decay Lifetime Measurement. Japanese Journal of Applied Physics, 39. doi:10.1143/jjap.39.l1124
Noji, Masaki, Kiyama, Makoto, Tajima, Michio (2000) Characterization of Interface in GaAs Epitaxial Wafer by Spatially Resolved Photoluminescence from Cleaved Face. Japanese Journal of Applied Physics, 39. 2585-2586 doi:10.1143/jjap.39.2585
Sugimoto, Hiroki, Inoue, Masaaki, Tajima, Michio, Ogura, Atsushi, Ohshita, Yoshio (2006) Analysis of Intra-Grain Defects in Multicrystalline Silicon Wafers by Photoluminescence Mapping and Spectroscopy. Japanese Journal of Applied Physics, 45. doi:10.1143/jjap.45.l641
Kuwata, Jun, Onoda, Makoto, Uchino, Kenji, Nomura, Shoichiro (1981) Dielectric Losses in Bi12GeO20Single Crystals. Japanese Journal of Applied Physics, 20 (8) 1609-1610 doi:10.1143/jjap.20.1609
 
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