Reference Type | Journal (article/letter/editorial) |
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Title | Formation of Thick, Thermally-Stable High-Resistivity-Layers in GaAs by Oxygen Ion Implantation |
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Journal | Japanese Journal of Applied Physics |
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Authors | Asano, Tanemasa | Author |
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Atanassov, Rosen D. | Author |
Ishiwara, Hiroshi | Author |
Furukawa, Seijiro | Author |
Year | 1981 (May) | Volume | 20 |
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Issue | 5 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.20.901Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14984983 | Long-form Identifier | mindat:1:5:14984983:0 |
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GUID | 0 |
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Full Reference | Asano, Tanemasa, Atanassov, Rosen D., Ishiwara, Hiroshi, Furukawa, Seijiro (1981) Formation of Thick, Thermally-Stable High-Resistivity-Layers in GaAs by Oxygen Ion Implantation. Japanese Journal of Applied Physics, 20 (5) 901-907 doi:10.1143/jjap.20.901 |
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Plain Text | Asano, Tanemasa, Atanassov, Rosen D., Ishiwara, Hiroshi, Furukawa, Seijiro (1981) Formation of Thick, Thermally-Stable High-Resistivity-Layers in GaAs by Oxygen Ion Implantation. Japanese Journal of Applied Physics, 20 (5) 901-907 doi:10.1143/jjap.20.901 |
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In | (1981, May) Japanese Journal of Applied Physics Vol. 20 (5) Japan Society of Applied Physics |
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