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Morita, Seizo, Tsukada, Shuichi, Mikoshiba, Nobuo (1987) Atomic Images of Disordered Regions in Graphite Crystals Obtained with Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1511

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Reference TypeJournal (article/letter/editorial)
TitleAtomic Images of Disordered Regions in Graphite Crystals Obtained with Scanning Tunneling Microscope
JournalJapanese Journal of Applied Physics
AuthorsMorita, SeizoAuthor
Tsukada, ShuichiAuthor
Mikoshiba, NobuoAuthor
Year1987 (September 20)Volume26
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.26.l1511Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14989968Long-form Identifiermindat:1:5:14989968:2
GUID0
Full ReferenceMorita, Seizo, Tsukada, Shuichi, Mikoshiba, Nobuo (1987) Atomic Images of Disordered Regions in Graphite Crystals Obtained with Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1511
Plain TextMorita, Seizo, Tsukada, Shuichi, Mikoshiba, Nobuo (1987) Atomic Images of Disordered Regions in Graphite Crystals Obtained with Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1511
In(1987) Japanese Journal of Applied Physics Vol. 26. Japan Society of Applied Physics

See Also

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Morita, Seizo, Tsukada, Shuichi, Mikoshiba, Nobuo (1987) Atomic Corrugation of Kish Graphite in Air Measured with Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l306
Morita, Seizo, Itaya, Kingo, Mikoshiba, Nobuo (1986) Images of Barrier Layer of Anodic Aluminum Oxide in Air Obtained with Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 25. doi:10.1143/jjap.25.l743
Morita, Seizo, Otsuka, Ichiro, Okada, Takao, Yokoyama, Hiraku, Iwasaki, Takatoshi, Mikoshiba, Nobuo (1987) Construction of a Scanning Tunneling Microscope for Electrochemical Studies. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1853
Mikoshiba, Nobuo, Morita, Seizo, Ishigame, Yuri (1987) Multilayer Piezoelectric Actuators for Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. 200 doi:10.7567/jjaps.26s1.200
Sugawara, Yasuhiro, Ishizaka, Tatsuya, Morita, Seizo (1990) Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM) Japanese Journal of Applied Physics, 29. 1539-1543 doi:10.1143/jjap.29.1539
Morita, Seizo, Sugawara, Yasuhiro, Fukano, Yoshinobu (1993) Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]. Japanese Journal of Applied Physics, 32. 2983-2988 doi:10.1143/jjap.32.2983
Morita, Seizo, Okada, Takao, Ishigame, Yuri, Sato, Chiaki, Mikoshiba, Nobuo (1986) Voltage-Dependence of Scanning Tunneling Microscopy on Titanium Surface in Air. Japanese Journal of Applied Physics, 25. doi:10.1143/jjap.25.l516
Sugawara, Yasuhiro, Ishizaka, Tatsuya, Morita, Seizo, Imai, Syozo, Mikoshiba, Nobuo (1990) Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface. Japanese Journal of Applied Physics, 29. doi:10.1143/jjap.29.l157
Sugawara, Yasuhiro, Ishizaka, Tatsuya, Morita, Seizo, Imai, Syozo, Mikoshiba, Nobuo (1990) Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface. Japanese Journal of Applied Physics, 29. doi:10.1143/jjap.29.l502
Noguchi, Takashi, Takado, Seiichi, Morita, Seizo, Mikoshiba, Nobuo (1980) Tunneling-Type Temperature Dependence of Critical Current in Nb-Sn Point Contact. Japanese Journal of Applied Physics, 19 (8) doi:10.1143/jjap.19.l473
Morita, Seizo, Ishizaka, Tatsuya, Sugawara, Yasuhiro, Okada, Takao, Mishima, Syuzo, Imai, Syozo, Mikoshiba, Nobuo (1989) Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l1634
 
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