Lee, Eun Sun, Jung, Dong Jin, Kang, Young Min, Kim, Hyun Ho, Hong, Young Ki, Park, Jung Hoon, Kang, Seung Kuk, Kim, Jae Hyun, Kim, Hee San, Jung, Won Woong, Ahn, Woo Song, Jung, Ju Young, Kang, Jin Young, Choi, Do Yeon, Goh, Han Kyung, Kim, Song Yi, Lee, Sang Young, Jeong, Hong Sik (2008) A Characterization of Endurance in 64 Mbit Ferroelectric Random Access Memory by Analyzing the Space Charge Concentration. Japanese Journal of Applied Physics, 47 (4) 2725-2727 doi:10.1143/jjap.47.2725
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A Characterization of Endurance in 64 Mbit Ferroelectric Random Access Memory by Analyzing the Space Charge Concentration | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Lee, Eun Sun | Author | |
| Jung, Dong Jin | Author | ||
| Kang, Young Min | Author | ||
| Kim, Hyun Ho | Author | ||
| Hong, Young Ki | Author | ||
| Park, Jung Hoon | Author | ||
| Kang, Seung Kuk | Author | ||
| Kim, Jae Hyun | Author | ||
| Kim, Hee San | Author | ||
| Jung, Won Woong | Author | ||
| Ahn, Woo Song | Author | ||
| Jung, Ju Young | Author | ||
| Kang, Jin Young | Author | ||
| Choi, Do Yeon | Author | ||
| Goh, Han Kyung | Author | ||
| Kim, Song Yi | Author | ||
| Lee, Sang Young | Author | ||
| Jeong, Hong Sik | Author | ||
| Year | 2008 (April 25) | Volume | 47 |
| Issue | 4 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.47.2725Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15031793 | Long-form Identifier | mindat:1:5:15031793:9 |
| GUID | 0 | ||
| Full Reference | Lee, Eun Sun, Jung, Dong Jin, Kang, Young Min, Kim, Hyun Ho, Hong, Young Ki, Park, Jung Hoon, Kang, Seung Kuk, Kim, Jae Hyun, Kim, Hee San, Jung, Won Woong, Ahn, Woo Song, Jung, Ju Young, Kang, Jin Young, Choi, Do Yeon, Goh, Han Kyung, Kim, Song Yi, Lee, Sang Young, Jeong, Hong Sik (2008) A Characterization of Endurance in 64 Mbit Ferroelectric Random Access Memory by Analyzing the Space Charge Concentration. Japanese Journal of Applied Physics, 47 (4) 2725-2727 doi:10.1143/jjap.47.2725 | ||
| Plain Text | Lee, Eun Sun, Jung, Dong Jin, Kang, Young Min, Kim, Hyun Ho, Hong, Young Ki, Park, Jung Hoon, Kang, Seung Kuk, Kim, Jae Hyun, Kim, Hee San, Jung, Won Woong, Ahn, Woo Song, Jung, Ju Young, Kang, Jin Young, Choi, Do Yeon, Goh, Han Kyung, Kim, Song Yi, Lee, Sang Young, Jeong, Hong Sik (2008) A Characterization of Endurance in 64 Mbit Ferroelectric Random Access Memory by Analyzing the Space Charge Concentration. Japanese Journal of Applied Physics, 47 (4) 2725-2727 doi:10.1143/jjap.47.2725 | ||
| In | (2008, April) Japanese Journal of Applied Physics Vol. 47 (4) Japan Society of Applied Physics | ||
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