Lee, Joung-Eob, Kim, Garam, Kim, Kyung-Wan, Lee, Jung-Han, Kang, Kwon-Chil, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook (2011) Dynamic Driving Current Using Side Gate Bias of Single-Electron Transistors. Japanese Journal of Applied Physics, 50 (7) 74101 doi:10.1143/jjap.50.074101
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Dynamic Driving Current Using Side Gate Bias of Single-Electron Transistors | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Lee, Joung-Eob | Author | |
| Kim, Garam | Author | ||
| Kim, Kyung-Wan | Author | ||
| Lee, Jung-Han | Author | ||
| Kang, Kwon-Chil | Author | ||
| Lee, Jong-Ho | Author | ||
| Shin, Hyungcheol | Author | ||
| Park, Byung-Gook | Author | ||
| Year | 2011 (July 20) | Volume | 50 |
| Issue | 7 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.50.074101Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15038861 | Long-form Identifier | mindat:1:5:15038861:8 |
| GUID | 0 | ||
| Full Reference | Lee, Joung-Eob, Kim, Garam, Kim, Kyung-Wan, Lee, Jung-Han, Kang, Kwon-Chil, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook (2011) Dynamic Driving Current Using Side Gate Bias of Single-Electron Transistors. Japanese Journal of Applied Physics, 50 (7) 74101 doi:10.1143/jjap.50.074101 | ||
| Plain Text | Lee, Joung-Eob, Kim, Garam, Kim, Kyung-Wan, Lee, Jung-Han, Kang, Kwon-Chil, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook (2011) Dynamic Driving Current Using Side Gate Bias of Single-Electron Transistors. Japanese Journal of Applied Physics, 50 (7) 74101 doi:10.1143/jjap.50.074101 | ||
| In | (2011, July) Japanese Journal of Applied Physics Vol. 50 (7) Japan Society of Applied Physics | ||
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