Schaefer, Erik D., Chernov, Sergey V., Sapozhnik, Alexey A., Kostyuk, Dmytro M., Zaporozhchenko, Anna V., Protsenko, Serhiy I., Bode, Matthias, Nepijko, Sergej A., Elmers, Hans-Joachim, Schönhense, Gerd (2016) Morphological and magnetic analysis of Fe nanostructures on W(110) by using scanning tunneling microscopy and Lorentz microscopy. Japanese Journal of Applied Physics, 55 (2) 2 doi:10.7567/jjap.55.02bc11
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Morphological and magnetic analysis of Fe nanostructures on W(110) by using scanning tunneling microscopy and Lorentz microscopy | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Schaefer, Erik D. | Author | |
Chernov, Sergey V. | Author | ||
Sapozhnik, Alexey A. | Author | ||
Kostyuk, Dmytro M. | Author | ||
Zaporozhchenko, Anna V. | Author | ||
Protsenko, Serhiy I. | Author | ||
Bode, Matthias | Author | ||
Nepijko, Sergej A. | Author | ||
Elmers, Hans-Joachim | Author | ||
Schönhense, Gerd | Author | ||
Year | 2016 (February 1) | Volume | 55 |
Issue | 2 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.7567/jjap.55.02bc11Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15045904 | Long-form Identifier | mindat:1:5:15045904:2 |
GUID | 0 | ||
Full Reference | Schaefer, Erik D., Chernov, Sergey V., Sapozhnik, Alexey A., Kostyuk, Dmytro M., Zaporozhchenko, Anna V., Protsenko, Serhiy I., Bode, Matthias, Nepijko, Sergej A., Elmers, Hans-Joachim, Schönhense, Gerd (2016) Morphological and magnetic analysis of Fe nanostructures on W(110) by using scanning tunneling microscopy and Lorentz microscopy. Japanese Journal of Applied Physics, 55 (2) 2 doi:10.7567/jjap.55.02bc11 | ||
Plain Text | Schaefer, Erik D., Chernov, Sergey V., Sapozhnik, Alexey A., Kostyuk, Dmytro M., Zaporozhchenko, Anna V., Protsenko, Serhiy I., Bode, Matthias, Nepijko, Sergej A., Elmers, Hans-Joachim, Schönhense, Gerd (2016) Morphological and magnetic analysis of Fe nanostructures on W(110) by using scanning tunneling microscopy and Lorentz microscopy. Japanese Journal of Applied Physics, 55 (2) 2 doi:10.7567/jjap.55.02bc11 | ||
In | (2016, February) Japanese Journal of Applied Physics Vol. 55 (2) Japan Society of Applied Physics |
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