SCHWARTZ, J. SANFORD (1994) Measuring Quality: Where Are We? Where Are We Going? And How Will We Know When We Get There?. Annals of the New York Academy of Sciences, 729 (1) 150-158 doi:10.1111/j.1749-6632.1994.tb12228.x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Measuring Quality: Where Are We? Where Are We Going? And How Will We Know When We Get There? | ||
Journal | Annals of the New York Academy of Sciences | ||
Authors | SCHWARTZ, J. SANFORD | Author | |
Year | 1994 (August) | Volume | 729 |
Issue | 1 | ||
Publisher | Wiley | ||
DOI | doi:10.1111/j.1749-6632.1994.tb12228.xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 1506512 | Long-form Identifier | mindat:1:5:1506512:0 |
GUID | 0 | ||
Full Reference | SCHWARTZ, J. SANFORD (1994) Measuring Quality: Where Are We? Where Are We Going? And How Will We Know When We Get There?. Annals of the New York Academy of Sciences, 729 (1) 150-158 doi:10.1111/j.1749-6632.1994.tb12228.x | ||
Plain Text | SCHWARTZ, J. SANFORD (1994) Measuring Quality: Where Are We? Where Are We Going? And How Will We Know When We Get There?. Annals of the New York Academy of Sciences, 729 (1) 150-158 doi:10.1111/j.1749-6632.1994.tb12228.x | ||
In | (1994, August) Annals of the New York Academy of Sciences Vol. 729 (1) Wiley |
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