Thompson, D. J., Backer, W. H., Bassetti, M., Coisson, R., Degele, D., Le Duff, J., Dupont, F., Hofmann, A., Husmann, D., Mulhaupt, G., Perot, J., Renard, M., Sommer, M., Suller, V. P., Tazzari, S. (1979) An X-Ray Synchrotron Source for Europe. IEEE Transactions on Nuclear Science, 26 (3) 3809-3811 doi:10.1109/tns.1979.4330616
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | An X-Ray Synchrotron Source for Europe | ||
| Journal | IEEE Transactions on Nuclear Science | ||
| Authors | Thompson, D. J. | Author | |
| Backer, W. H. | Author | ||
| Bassetti, M. | Author | ||
| Coisson, R. | Author | ||
| Degele, D. | Author | ||
| Le Duff, J. | Author | ||
| Dupont, F. | Author | ||
| Hofmann, A. | Author | ||
| Husmann, D. | Author | ||
| Mulhaupt, G. | Author | ||
| Perot, J. | Author | ||
| Renard, M. | Author | ||
| Sommer, M. | Author | ||
| Suller, V. P. | Author | ||
| Tazzari, S. | Author | ||
| Year | 1979 (June) | Volume | 26 |
| Issue | 3 | ||
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
| DOI | doi:10.1109/tns.1979.4330616Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15565561 | Long-form Identifier | mindat:1:5:15565561:6 |
| GUID | 0 | ||
| Full Reference | Thompson, D. J., Backer, W. H., Bassetti, M., Coisson, R., Degele, D., Le Duff, J., Dupont, F., Hofmann, A., Husmann, D., Mulhaupt, G., Perot, J., Renard, M., Sommer, M., Suller, V. P., Tazzari, S. (1979) An X-Ray Synchrotron Source for Europe. IEEE Transactions on Nuclear Science, 26 (3) 3809-3811 doi:10.1109/tns.1979.4330616 | ||
| Plain Text | Thompson, D. J., Backer, W. H., Bassetti, M., Coisson, R., Degele, D., Le Duff, J., Dupont, F., Hofmann, A., Husmann, D., Mulhaupt, G., Perot, J., Renard, M., Sommer, M., Suller, V. P., Tazzari, S. (1979) An X-Ray Synchrotron Source for Europe. IEEE Transactions on Nuclear Science, 26 (3) 3809-3811 doi:10.1109/tns.1979.4330616 | ||
| In | (1979, June) IEEE Transactions on Nuclear Science Vol. 26 (3) Institute of Electrical and Electronics Engineers (IEEE) | ||
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