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Yamin, Peter, Repeta, Louis (1979) Tests of a New Secondary Emission Chamber at the AGS. IEEE Transactions on Nuclear Science, 26 (3) 3415-3416 doi:10.1109/tns.1979.4330054

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Reference TypeJournal (article/letter/editorial)
TitleTests of a New Secondary Emission Chamber at the AGS
JournalIEEE Transactions on Nuclear Science
AuthorsYamin, PeterAuthor
Repeta, LouisAuthor
Year1979 (June)Volume26
Issue3
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1979.4330054Search in ResearchGate
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Mindat Ref. ID15565705Long-form Identifiermindat:1:5:15565705:4
GUID0
Full ReferenceYamin, Peter, Repeta, Louis (1979) Tests of a New Secondary Emission Chamber at the AGS. IEEE Transactions on Nuclear Science, 26 (3) 3415-3416 doi:10.1109/tns.1979.4330054
Plain TextYamin, Peter, Repeta, Louis (1979) Tests of a New Secondary Emission Chamber at the AGS. IEEE Transactions on Nuclear Science, 26 (3) 3415-3416 doi:10.1109/tns.1979.4330054
In(1979, June) IEEE Transactions on Nuclear Science Vol. 26 (3) Institute of Electrical and Electronics Engineers (IEEE)

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Glenn, J. W., Smith, G. A., Sandberg, J. N., Repeta, L., Weisberg, H. (1979) AGS Slow Extraction Improvements. IEEE Transactions on Nuclear Science, 26 (3) 3167-3169 doi:10.1109/tns.1979.4329972
Anne, R., Van Den Bossche, M. (1979) A Secondary Emission-Multiwire Chamber for Ganil Heavy Ion Beams Tuning. IEEE Transactions on Nuclear Science, 26 (2) 2379-2380 doi:10.1109/tns.1979.4329880
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(1979) IEEE Transactions on Nuclear Science. IEEE Transactions on Nuclear Science, 26 (3) doi:10.1109/tns.1979.4329906
Witkover, R. L. (1979) Microprocessor Based Beam Loss Monitor System for the AGS. IEEE Transactions on Nuclear Science, 26 (3) 3313-3315 doi:10.1109/tns.1979.4330020
Pedersen, F., Raka, E. C. (1979) A Measurement of the Longitudinal Coupling Impedance in the Brookhaven Ags. IEEE Transactions on Nuclear Science, 26 (3) 3592-3594 doi:10.1109/tns.1979.4330110
Barale, John J., Crebbin, Kenneth C., Lax, John W., Richter, Robert M., Zajec, Emery (1979) Secondary Emission Monitors at the Bevatron-Bevalac. IEEE Transactions on Nuclear Science, 26 (3) 3412-3414 doi:10.1109/tns.1979.4330053
Nitz, David (1979) A Digital Drift Chamber Digitizer System. IEEE Transactions on Nuclear Science, 26 (1) 246-250 doi:10.1109/tns.1979.4329640
Barton, D. S., Witkover, R. L. (1981) Negative Ion Source Tests for H- Injection at the Brookhaven AGS. IEEE Transactions on Nuclear Science, 28 (3) 2681-2683 doi:10.1109/tns.1981.4331796
(1979) IEEE Transactions on Nuclear Science. IEEE Transactions on Nuclear Science, 26 (1) doi:10.1109/tns.1979.4329599
(1979) IEEE Transactions on Nuclear Science. IEEE Transactions on Nuclear Science, 26 (1) doi:10.1109/tns.1979.4330300
 
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