Reference Type | Journal (article/letter/editorial) |
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Title | Simulation Measurement of Bunch Excited Fields and Energy Loss in Vacuum Chamber Components and Cavities |
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Journal | IEEE Transactions on Nuclear Science |
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Authors | Billing, Michael G. | Author |
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Kirchgessner, Joseph L. | Author |
Sundelin, Ronald M. | Author |
Year | 1979 (June) | Volume | 26 |
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Issue | 3 |
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Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
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DOI | doi:10.1109/tns.1979.4330107Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 15565739 | Long-form Identifier | mindat:1:5:15565739:9 |
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GUID | 0 |
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Full Reference | Billing, Michael G., Kirchgessner, Joseph L., Sundelin, Ronald M. (1979) Simulation Measurement of Bunch Excited Fields and Energy Loss in Vacuum Chamber Components and Cavities. IEEE Transactions on Nuclear Science, 26 (3) 3583-3585 doi:10.1109/tns.1979.4330107 |
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Plain Text | Billing, Michael G., Kirchgessner, Joseph L., Sundelin, Ronald M. (1979) Simulation Measurement of Bunch Excited Fields and Energy Loss in Vacuum Chamber Components and Cavities. IEEE Transactions on Nuclear Science, 26 (3) 3583-3585 doi:10.1109/tns.1979.4330107 |
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In | (1979, June) IEEE Transactions on Nuclear Science Vol. 26 (3) Institute of Electrical and Electronics Engineers (IEEE) |
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