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Sasada, T., Ichikawa, S., Kanai, T. (2006) Measurement of Single-Event Effects on a Large Number of Commercial DRAMs. IEEE Transactions on Nuclear Science, 53 (4) 1806-1812 doi:10.1109/tns.2006.880928

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of Single-Event Effects on a Large Number of Commercial DRAMs
JournalIEEE Transactions on Nuclear Science
AuthorsSasada, T.Author
Ichikawa, S.Author
Kanai, T.Author
Year2006 (August)Volume53
Issue4
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.2006.880928Search in ResearchGate
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Mindat Ref. ID15580979Long-form Identifiermindat:1:5:15580979:8
GUID0
Full ReferenceSasada, T., Ichikawa, S., Kanai, T. (2006) Measurement of Single-Event Effects on a Large Number of Commercial DRAMs. IEEE Transactions on Nuclear Science, 53 (4) 1806-1812 doi:10.1109/tns.2006.880928
Plain TextSasada, T., Ichikawa, S., Kanai, T. (2006) Measurement of Single-Event Effects on a Large Number of Commercial DRAMs. IEEE Transactions on Nuclear Science, 53 (4) 1806-1812 doi:10.1109/tns.2006.880928
In(2006, August) IEEE Transactions on Nuclear Science Vol. 53 (4) Institute of Electrical and Electronics Engineers (IEEE)

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