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Stan, Gheorghe, Ciobanu, Cristian V., King, Sean W. (2022) Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14 (49) 55238-55248 doi:10.1021/acsami.2c17962

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Reference TypeJournal (article/letter/editorial)
TitleResolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy
JournalACS Applied Materials & Interfaces
AuthorsStan, GheorgheAuthor
Ciobanu, Cristian V.Author
King, Sean W.Author
Year2022 (December 14)Volume14
Issue49
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/acsami.2c17962Search in ResearchGate
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Mindat Ref. ID15602015Long-form Identifiermindat:1:5:15602015:4
GUID0
Full ReferenceStan, Gheorghe, Ciobanu, Cristian V., King, Sean W. (2022) Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14 (49) 55238-55248 doi:10.1021/acsami.2c17962
Plain TextStan, Gheorghe, Ciobanu, Cristian V., King, Sean W. (2022) Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14 (49) 55238-55248 doi:10.1021/acsami.2c17962
In(2022, December) ACS Applied Materials & Interfaces Vol. 14 (49) American Chemical Society (ACS)

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Stan, Gheorghe, King, Sean W., Cook, Robert F. (2009) Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy. Journal of Materials Research, 24 (9) 2960-2964 doi:10.1557/jmr.2009.0357
Nguyen, Hung K., Shundo, Atsuomi, Liang, Xiaobin, Yamamoto, Satoru, Tanaka, Keiji, Nakajima, Ken (2022) Unraveling Nanoscale Elastic and Adhesive Properties at the Nanoparticle/Epoxy Interface Using Bimodal Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14 (37) 42713-42722 doi:10.1021/acsami.2c12335
Cortelli, Giorgio, Grob, Leroy, Patruno, Luca, Cramer, Tobias, Mayer, Dirk, Fraboni, Beatrice, Wolfrum, Bernhard, de Miranda, Stefano (2023) Determination of Stiffness and the Elastic Modulus of 3D-Printed Micropillars with Atomic Force Microscopy–Force Spectroscopy. ACS Applied Materials & Interfaces, 15 (5) 7602-7609 doi:10.1021/acsami.2c21921
Stan, Gheorghe, Solares, Santiago D., Pittenger, Bede, Erina, Natalia, Su, Chanmin (2014) Nanoscale mechanics by tomographic contact resonance atomic force microscopy. Nanoscale, 6. 962-969 doi:10.1039/c3nr04981g
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Bonafè, Filippo, Dong, Chaoqun, Malliaras, George G., Cramer, Tobias, Fraboni, Beatrice (2024) Subsurface Profiling of Ion Migration and Swelling in Conducting Polymer Actuators with Modulated Electrochemical Atomic Force Microscopy. ACS Applied Materials & Interfaces, 16 (28) 36727-36734 doi:10.1021/acsami.4c08459
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Bie, Yige; Ogura, Yuta; Ono, Hayate; Arao, Yoshihiko (2025) High-Modulus Composite Films Fabricated via Adsorption between Delaminated Cellulose Nanofibers and Graphene Nanoplatelets. ACS Applied Materials & Interfaces, 17 (32). doi:10.1021/acsami.5c10619
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