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Zhang, Weiqi, Sun, Nana, Zhou, Dayu (2023) Effect of Y2O3 interlayer on the electric properties of Y-doped HfO2 film deposited by chemical solution deposition. Ceramics International, 49 (5) 7670-7675 doi:10.1016/j.ceramint.2022.10.268

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Reference TypeJournal (article/letter/editorial)
TitleEffect of Y2O3 interlayer on the electric properties of Y-doped HfO2 film deposited by chemical solution deposition
JournalCeramics International
AuthorsZhang, WeiqiAuthor
Sun, NanaAuthor
Zhou, DayuAuthor
Year2023 (March)Volume49
Issue5
PublisherElsevier BV
DOIdoi:10.1016/j.ceramint.2022.10.268Search in ResearchGate
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Mindat Ref. ID15692709Long-form Identifiermindat:1:5:15692709:5
GUID0
Full ReferenceZhang, Weiqi, Sun, Nana, Zhou, Dayu (2023) Effect of Y2O3 interlayer on the electric properties of Y-doped HfO2 film deposited by chemical solution deposition. Ceramics International, 49 (5) 7670-7675 doi:10.1016/j.ceramint.2022.10.268
Plain TextZhang, Weiqi, Sun, Nana, Zhou, Dayu (2023) Effect of Y2O3 interlayer on the electric properties of Y-doped HfO2 film deposited by chemical solution deposition. Ceramics International, 49 (5) 7670-7675 doi:10.1016/j.ceramint.2022.10.268
In(2023, March) Ceramics International Vol. 49 (5) Elsevier BV

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