Pillmeier, Simon, Pippan, Reinhard, Eckert, Jürgen, Hohenwarter, Anton (2023) Fatigue crack growth behavior of a nanocrystalline low Young's modulus β-type Ti–Nb alloy. Materials Science and Engineering: A, 871. 144868 doi:10.1016/j.msea.2023.144868
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Fatigue crack growth behavior of a nanocrystalline low Young's modulus β-type Ti–Nb alloy | ||
Journal | Materials Science and Engineering: A | ||
Authors | Pillmeier, Simon | Author | |
Pippan, Reinhard | Author | ||
Eckert, Jürgen | Author | ||
Hohenwarter, Anton | Author | ||
Year | 2023 (April) | Volume | 871 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.msea.2023.144868Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15743822 | Long-form Identifier | mindat:1:5:15743822:4 |
GUID | 0 | ||
Full Reference | Pillmeier, Simon, Pippan, Reinhard, Eckert, Jürgen, Hohenwarter, Anton (2023) Fatigue crack growth behavior of a nanocrystalline low Young's modulus β-type Ti–Nb alloy. Materials Science and Engineering: A, 871. 144868 doi:10.1016/j.msea.2023.144868 | ||
Plain Text | Pillmeier, Simon, Pippan, Reinhard, Eckert, Jürgen, Hohenwarter, Anton (2023) Fatigue crack growth behavior of a nanocrystalline low Young's modulus β-type Ti–Nb alloy. Materials Science and Engineering: A, 871. 144868 doi:10.1016/j.msea.2023.144868 | ||
In | (2023) Materials Science and Engineering: A Vol. 871. Elsevier BV |
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