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Hu, Shuo, Li, Hongyu, Dong, Bo, Ma, Chuan, Zhang, Shuai, Liu, Haozhe, Lu, Lihua, Chen, Jiaxuan, Miao, Xinxiang (2023) Micron-size bubble defects in fused silica and its laser induced damage near 355 nm. Ceramics International, 49 (8) 11753-11767 doi:10.1016/j.ceramint.2022.11.302

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Reference TypeJournal (article/letter/editorial)
TitleMicron-size bubble defects in fused silica and its laser induced damage near 355 nm
JournalCeramics International
AuthorsHu, ShuoAuthor
Li, HongyuAuthor
Dong, BoAuthor
Ma, ChuanAuthor
Zhang, ShuaiAuthor
Liu, HaozheAuthor
Lu, LihuaAuthor
Chen, JiaxuanAuthor
Miao, XinxiangAuthor
Year2023 (April)Volume49
Issue8
PublisherElsevier BV
DOIdoi:10.1016/j.ceramint.2022.11.302Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15743902Long-form Identifiermindat:1:5:15743902:3
GUID0
Full ReferenceHu, Shuo, Li, Hongyu, Dong, Bo, Ma, Chuan, Zhang, Shuai, Liu, Haozhe, Lu, Lihua, Chen, Jiaxuan, Miao, Xinxiang (2023) Micron-size bubble defects in fused silica and its laser induced damage near 355 nm. Ceramics International, 49 (8) 11753-11767 doi:10.1016/j.ceramint.2022.11.302
Plain TextHu, Shuo, Li, Hongyu, Dong, Bo, Ma, Chuan, Zhang, Shuai, Liu, Haozhe, Lu, Lihua, Chen, Jiaxuan, Miao, Xinxiang (2023) Micron-size bubble defects in fused silica and its laser induced damage near 355 nm. Ceramics International, 49 (8) 11753-11767 doi:10.1016/j.ceramint.2022.11.302
In(2023, April) Ceramics International Vol. 49 (8) Elsevier BV

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