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Elder, D. I., Clawson, A. R. (1984) Determination of In0.53Ga0.47As layer thicknesses from ethched steps. Journal of Materials Science Letters, 3 (4) 340 doi:10.1007/bf00729391

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of In0.53Ga0.47As layer thicknesses from ethched steps
JournalJournal of Materials Science Letters
AuthorsElder, D. I.Author
Clawson, A. R.Author
Year1984 (April)Volume3
Issue4
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00729391Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16408878Long-form Identifiermindat:1:5:16408878:8
GUID0
Full ReferenceElder, D. I., Clawson, A. R. (1984) Determination of In0.53Ga0.47As layer thicknesses from ethched steps. Journal of Materials Science Letters, 3 (4) 340 doi:10.1007/bf00729391
Plain TextElder, D. I., Clawson, A. R. (1984) Determination of In0.53Ga0.47As layer thicknesses from ethched steps. Journal of Materials Science Letters, 3 (4) 340 doi:10.1007/bf00729391
In(1984, April) Journal of Materials Science Letters Vol. 3 (4) Springer Science and Business Media LLC

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Clawson, A.R., Mullin, D.P., Elder, D.I., Wieder, H.H. (1983) Semi-insulating In0.53Ga0.47As by Fe doping. Journal of Crystal Growth, 64 (1). 90-95 doi:10.1016/0022-0248(83)90253-1
Lum, W. Y., Clawson, A. R., Elder, D. I., Wieder, H. H. (1978) Epilayer‐substrate interfaces of Ge‐doped GaAs grown by liquid‐phase epitaxy. Journal of Applied Physics, 49 (6). 3333-3336 doi:10.1063/1.325287
Tomellini, M., Bianconi, A., Garcia, J., Gozzi, D., Gargano, A., Davoli, I., Marcelli, A. (1986) Local structure determination by surface XANES spectroscopy of SiO2 amorphous layer on NiO. Journal of Materials Science Letters, 5 (4) 441-442 doi:10.1007/bf01672355
Butz, R., Wagner, H. (1973) The determination of thin layer thicknesses with an electron microprobe. Surface Science, 34 (3). 693-704 doi:10.1016/0039-6028(73)90036-8
Elkin, I. A., Volkov, V. A., Stolbov, K. S., Kolodkin, D. A., Chulkina, A. A., Bel’tyukov, A. N. (2018) The features of metal powders consolidation by layer-by-layer electric discharge sintering. Letters on Materials, 8. 335-340 doi:10.22226/2410-3535-2018-3-335-340
Pratt, Kenneth W. (1984) Chronoamperometric determination of diffusion-layer thicknesses at hydrodynamic electrodes. Analytical Chemistry, 56 (11). 1967-1970 doi:10.1021/ac00275a049
Polvani, R. S., Ruff, A. W., Strutt, P. R. (1984) A mechanism for metalloid strengthening of Udimet-700. Journal of Materials Science Letters, 3 (4) 287-290 doi:10.1007/bf00729374
Smith, E. (1985) Tearing resistance of human and animal membranes. Journal of Materials Science Letters, 4 (3) 338-340 doi:10.1007/bf00719808
Maxwell, D., Young, R. J., Kinloch, A. J. (1984) Hybrid particulate-filled epoxy-polymers. Journal of Materials Science Letters, 3 (1) 9-12 doi:10.1007/bf00720061
Harrison, P. L. (1984) The ratios of layer thicknesses in a multiphase oxide scale. Oxidation of Metals, 22. 35-43 doi:10.1007/bf00659247
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