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Ray, A. K., Hogarth, C. A. (1984) The effect of insulator thickness on the forming of a MIM device. Journal of Materials Science Letters, 3 (4) 331-332 doi:10.1007/bf00729388

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Reference TypeJournal (article/letter/editorial)
TitleThe effect of insulator thickness on the forming of a MIM device
JournalJournal of Materials Science Letters
AuthorsRay, A. K.Author
Hogarth, C. A.Author
Year1984 (April)Volume3
Issue4
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00729388Search in ResearchGate
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Mindat Ref. ID16408890Long-form Identifiermindat:1:5:16408890:0
GUID0
Full ReferenceRay, A. K., Hogarth, C. A. (1984) The effect of insulator thickness on the forming of a MIM device. Journal of Materials Science Letters, 3 (4) 331-332 doi:10.1007/bf00729388
Plain TextRay, A. K., Hogarth, C. A. (1984) The effect of insulator thickness on the forming of a MIM device. Journal of Materials Science Letters, 3 (4) 331-332 doi:10.1007/bf00729388
In(1984, April) Journal of Materials Science Letters Vol. 3 (4) Springer Science and Business Media LLC

See Also

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Ray, A. K., Hogarth, C. A. (1985) On the evaluation of statistical parameters of a normal distribution of filamentary resistances in a formed MIM device. Journal of Materials Science Letters, 4 (12) 1522-1523 doi:10.1007/bf00721384
Ray, A. K., Hogarth, C. A. (1985) A mathematical analysis for the peak of the conduction characteristic of formed MIM devices. Journal of Materials Science Letters, 4 (5) 513-516 doi:10.1007/bf00720020
Arshak, K. I., Glot, A., Hogarth, C. A. (1985) The voltage-current characteristics of thin MIM sandwiches with SiO x /Bi2O3 as the insulator. Journal of Materials Science, 20. 3590-3596 doi:10.1007/bf01113765
Ahmed, M. M., Hogarth, C. A., Ghauri, M. A. (1984) X-ray diffraction, density and electrical conductivity studies of some zinc borate glasses. Journal of Materials Science Letters, 3 (4) 341-344 doi:10.1007/bf00729392
Hogarth, C. A., Hosseini, A. A. (1984) Infrared absorption and structural investigation of some vanadate glasses. Journal of Materials Science Letters, 3 (4) 359-362 doi:10.1007/bf00729397
Al-Ani, S. K. J., Hogarth, C. A., Ilyas, M. (1984) The optical absorption edge in thin amorphous oxide films based on germania. Journal of Materials Science Letters, 3 (5) 391-394 doi:10.1007/bf00724375
Anwar, M., Hogarth, C. A., Bulpett, R. (1989) Effect of substrate temperature and film thickness on the surface structure of some thin amorphous films of MoO3 studied by X-ray photoelectron spectroscopy (ESCA). Journal of Materials Science, 24. 3087-3090 doi:10.1007/bf01139023
Hogarth, C. A., Moridi, G. R. (1984) Infrared spectra of copper-calcium-phosphate glasses. Journal of Materials Science Letters, 3 (6) 481-483 doi:10.1007/bf00720977
Ahmed, M. M., Harani, R., Hogarth, C. A. (1984) The optical energy gap in praseodymium phosphate glasses. Journal of Materials Science Letters, 3 (12) 1055-1057 doi:10.1007/bf00719762
Amuzu, J. K. A. (1984) The effect of humidity on friction and shear strength of nylon. Journal of Materials Science Letters, 3 (4) 291-292 doi:10.1007/bf00729375
Khan, G. A., Hogarth, C. A. (1992) Electroforming in MIM structure of SiOx and SiOx/SnO composite dielectric thin films. Journal of Materials Science, 27. 2613-2618 doi:10.1007/bf00540677
 
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