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Lamine, A. Ben, Lahana, M. J., Reynaud, F., Stadelmann, P. (1984) Structure imaging of perfect V3Si (A15 structure) by high resolution electron microscopy. Journal of Materials Science Letters, 3 (5) 431-437 doi:10.1007/bf00724385

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Reference TypeJournal (article/letter/editorial)
TitleStructure imaging of perfect V3Si (A15 structure) by high resolution electron microscopy
JournalJournal of Materials Science Letters
AuthorsLamine, A. BenAuthor
Lahana, M. J.Author
Reynaud, F.Author
Stadelmann, P.Author
Year1984 (May)Volume3
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00724385Search in ResearchGate
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Mindat Ref. ID16408908Long-form Identifiermindat:1:5:16408908:2
GUID0
Full ReferenceLamine, A. Ben, Lahana, M. J., Reynaud, F., Stadelmann, P. (1984) Structure imaging of perfect V3Si (A15 structure) by high resolution electron microscopy. Journal of Materials Science Letters, 3 (5) 431-437 doi:10.1007/bf00724385
Plain TextLamine, A. Ben, Lahana, M. J., Reynaud, F., Stadelmann, P. (1984) Structure imaging of perfect V3Si (A15 structure) by high resolution electron microscopy. Journal of Materials Science Letters, 3 (5) 431-437 doi:10.1007/bf00724385
In(1984, May) Journal of Materials Science Letters Vol. 3 (5) Springer Science and Business Media LLC

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Lamine, A. Ben, Reynaud, F., Sénateur, J. P., Bouazra, Y. (1985) Electron microscopic investigation of a V5Si3needle-shaped precipitate in V3Si (A15 structure). Philosophical Magazine A, 52 (5). 657-668 doi:10.1080/01418618508237654
Reynaud, F., Lamine, A.Ben (1981) Dissociation d'une dislocation parfaite de translation en un couple de dispirations dans V3Si (structure A15). Acta Metallurgica, 29 (8). 1485-1493 doi:10.1016/0001-6160(81)90183-8
Ben lamine, Par A., Reynaud, F., Mai, C., Senateur, J. P. (1978) Mise en evidence d'un nouveau type de défaut réticulaire dans V3Si par microscopic électronique à haute tension (1000 kV). Philosophical Magazine A, 38 (3). 359-366 doi:10.1080/01418617808239241
Mäki, J. (1986) High-resolution electron microscopy imaging of a twin-like domain boundary inα′-Ag-Mg alloy. Journal of Materials Science Letters, 5 (11) 1119-1121 doi:10.1007/bf01742218
Mills, Michael J., Stadelmann, Pierre (1989) A study of the structure of Lomer and 60° dislocations in aluminium using high-resolution transmission electron microscopy. Philosophical Magazine A, 60 (3). 355-384 doi:10.1080/01418618908213867
Gaillard, Cedric, Stadelmann, Pierre A., Plummer, Christopher J. G., Fuchs, Gilbert (2006) Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy. Scanning, 26 (3). 122-130 doi:10.1002/sca.4950260304
Teuho, J., M�ki, J., Hirabayashi, M., Hiraga, K. (1985) High resolution electron microscopy imaging of a twin-like domain boundary in Au3Zn(H)-alloy. Journal of Materials Science Letters, 4 (7) 826-829 doi:10.1007/bf00720514
Spycher, R., Stadelmann, P., Buffat, P., Flueli, M. (1988) High-resolution electron microscopy image simulation on a Cray 1S/2300 computer. Journal of Electron Microscopy Technique, 10 (4). 369-372 doi:10.1002/jemt.1060100403
Weiser, B. A., Hollenberg, M. J., Mandelcorn, M., Temkin, R. J., Lea, P. J. (1991) The structure of the developing chick retinal pigment epithelium revealed by high resolution scanning electron microscopy. Journal of Electron Microscopy Technique, 18 (3). 231-240 doi:10.1002/jemt.1060180305
Williams, J. O., Crawford, E. S., Jenkins, J. LL., NG, T. L., Patterson, A. M., Scott, M. D., Cockayne, B., Wright, P. J. (1984) High resolution transmission electron microscopy (HRTEM) of epitaxially grown ZnSe and ZnSe/GaAs interfaces. Journal of Materials Science Letters, 3 (3) 189-193 doi:10.1007/bf00726789
Smith, P. P. K. (1984) Structure determination of diantimony tritin hexasulphide, Sn3Sb2S6, by high-resolution transmission electron microscopy. Acta Crystallographica Section C Crystal Structure Communications, 40 (4) 581-584 doi:10.1107/s0108270184004960
 
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