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Muragi, B. D., Zope, J. K. (1984) X-ray diffraction infrared absorption studies of Bi-Se-Te system. Journal of Materials Science Letters, 3 (8) 663-666 doi:10.1007/bf00719917

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Reference TypeJournal (article/letter/editorial)
TitleX-ray diffraction infrared absorption studies of Bi-Se-Te system
JournalJournal of Materials Science Letters
AuthorsMuragi, B. D.Author
Zope, J. K.Author
Year1984 (August)Volume3
Issue8
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00719917Search in ResearchGate
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Mindat Ref. ID16408981Long-form Identifiermindat:1:5:16408981:5
GUID0
Full ReferenceMuragi, B. D., Zope, J. K. (1984) X-ray diffraction infrared absorption studies of Bi-Se-Te system. Journal of Materials Science Letters, 3 (8) 663-666 doi:10.1007/bf00719917
Plain TextMuragi, B. D., Zope, J. K. (1984) X-ray diffraction infrared absorption studies of Bi-Se-Te system. Journal of Materials Science Letters, 3 (8) 663-666 doi:10.1007/bf00719917
In(1984, August) Journal of Materials Science Letters Vol. 3 (8) Springer Science and Business Media LLC

See Also

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Muragi, B.D., Zope, J.K. (1985) X-ray diffraction and infrared absorption of structurally disordered crystalline Sbî—¸Seî—¸Te systems. Materials Letters, 3. 222-225 doi:10.1016/0167-577x(85)90060-6
Zope, M. J., Zope, J. K. (1984) Nonlinear I?V behaviour and conductivity measurements in amorphous semiconducting Ge-As-Te system. Journal of Materials Science Letters, 3 (10) 850-852 doi:10.1007/bf00719569
Muragi, B.D., Zope, J.K. (1987) Electrical Transport Properties of Amorphous Semiconducting Sb-Se-Te System. Key Engineering Materials, 13. 509-514 doi:10.4028/www.scientific.net/kem.13-15.509
Zope, Madhavi, Muragi, B.D., Zope, J.K. (1988) Electrical conductivity measurements in a Geî—¸Seî—¸Ti system. Journal of Non-Crystalline Solids, 103 (2) 195-200 doi:10.1016/0022-3093(88)90198-6
Godovikov, A. A. (1962) X-ray diffraction investigation of individual representatives of the Bi?Se system. Journal of Structural Chemistry, 3 (1). 38-43 doi:10.1007/bf00745376
Roberts, K. J., Isherwood, B. J. (1984) Useful reflection sets for the analysis of lattice strains in cubic crystals using the X-ray multiple diffraction technique. Journal of Materials Science Letters, 3 (1) 29-32 doi:10.1007/bf00720067
Morgan, P. E. D. (1984) X-ray powder diffraction pattern and unit cell of BaSiN2. Journal of Materials Science Letters, 3 (2) 131-132 doi:10.1007/bf00723095
Hjartarson, G. A., Kao, K. C. (1984) Photoresponse of amorphous Se1?x Te x films. Journal of Materials Science Letters, 3 (3) 253-256 doi:10.1007/bf00726808
Byrappa, K., Prasad, J. Shashidhara, Srikantaswamy, S. (1986) High-temperature X-ray diffraction studies of berlinite crystals. Journal of Materials Science Letters, 5 (11) 1189-1190 doi:10.1007/bf01742243
Khan, M. N., Mohamed-Osman, A. E. (1986) Infrared and X-ray diffraction studies of TiO2—GeO2 glasses. Journal of Materials Science Letters, 5 (10) 965-968 doi:10.1007/bf01730250
Ghosh, T. B. (1988) X-ray diffraction studies of rapidly solidified pure lead. Journal of Materials Science Letters, 7 (7) 781-782 doi:10.1007/bf00722098
 
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