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Silva, E., Robinson, J. W., Northwood, D. O. (1986) Ion beam thinning of a zirconium alloy for transmission electron microscopy. Journal of Materials Science Letters, 5 (3) 343-346 doi:10.1007/bf01748100

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Reference TypeJournal (article/letter/editorial)
TitleIon beam thinning of a zirconium alloy for transmission electron microscopy
JournalJournal of Materials Science Letters
AuthorsSilva, E.Author
Robinson, J. W.Author
Northwood, D. O.Author
Year1986 (March)Volume5
Issue3
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf01748100Search in ResearchGate
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Mindat Ref. ID16409722Long-form Identifiermindat:1:5:16409722:3
GUID0
Full ReferenceSilva, E., Robinson, J. W., Northwood, D. O. (1986) Ion beam thinning of a zirconium alloy for transmission electron microscopy. Journal of Materials Science Letters, 5 (3) 343-346 doi:10.1007/bf01748100
Plain TextSilva, E., Robinson, J. W., Northwood, D. O. (1986) Ion beam thinning of a zirconium alloy for transmission electron microscopy. Journal of Materials Science Letters, 5 (3) 343-346 doi:10.1007/bf01748100
In(1986, March) Journal of Materials Science Letters Vol. 5 (3) Springer Science and Business Media LLC

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Gillespie, P., McLaren, A. C., Boland, J. N. (1971) Operating characteristics of an ion-bombardment apparatus for thinning non-metals for transmission electron microscopy. Journal of Materials Science, 6. 87-89 doi:10.1007/bf00550298
Krakauer, B. W., Gau, J. S., Smith, D. J. (1986) Structural characterization of yttrium oxide thin films using transmission electron microscopy. Journal of Materials Science Letters, 5 (6) 667-670 doi:10.1007/bf01731545
Wagner, G., Dreilich, A., Butter, E. (1988) Chemical thinning of III?V compound semiconductors for transmission electron microscopy. Journal of Materials Science, 23. 2761-2767 doi:10.1007/bf00547448
LEE, MIN-HEE, KIM, KYOU-HYUN (2016) Post-thinning using Ar ion-milling system for transmission electron microscopy specimens prepared by focused ion beam system. Journal of Microscopy, 261 (3). 243-248 doi:10.1111/jmi.12324
Kang, Zhenchuan (1986) A modified goodman's technique for obtaining rocking-beam type patterns. Journal of Electron Microscopy Technique, 4 (4). 343-346 doi:10.1002/jemt.1060040404
Goodhew, P. J. (1973) The sputtering of rough cylinders; applications to the thinning of fibres for transmission electron microscopy. Journal of Materials Science, 8. 581-589 doi:10.1007/bf00550464
Shankar, S., Riddle, Y. W., Makhlouf, M. M. (2003) Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy. Metallurgical and Materials Transactions A, 34 (3). 705-707 doi:10.1007/s11661-003-0105-1
McCaffrey, J.P., Phaneuf, M.W., Madsen, L.D. (2001) Surface damage formation during ion-beam thinning of samples for transmission electron microscopy. Ultramicroscopy, 87 (3). 97-104 doi:10.1016/s0304-3991(00)00096-6
Mäki, J. (1986) High-resolution electron microscopy imaging of a twin-like domain boundary inα′-Ag-Mg alloy. Journal of Materials Science Letters, 5 (11) 1119-1121 doi:10.1007/bf01742218
Desport, J. A., Moseley, P. T., Williams, D. E. (1982) Transmission electron microscopy of ceria gels. Journal of Materials Science Letters, 1 (7) 288-291 doi:10.1007/bf00728856
Hill, M J, Holt, D B, Unvala, B A (1968) Automatic jet thinning of GaAs for transmission electron microscopy. Journal of Physics E: Scientific Instruments, 1 (3). 301-302 doi:10.1088/0022-3735/1/3/307
 
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