Reference Type | Journal (article/letter/editorial) |
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Title | Defect identification in vapour-grownβ-SiC whiskers |
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Journal | Journal of Materials Science Letters |
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Authors | Iwanaga, H. | Author |
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Yoshiie, T. | Author |
Katuki, H. | Author |
Egashira, M. | Author |
Takeuchi, S. | Author |
Year | 1986 (September) | Volume | 5 |
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Issue | 9 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf01729284Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16409944 | Long-form Identifier | mindat:1:5:16409944:9 |
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GUID | 0 |
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Full Reference | Iwanaga, H., Yoshiie, T., Katuki, H., Egashira, M., Takeuchi, S. (1986) Defect identification in vapour-grownβ-SiC whiskers. Journal of Materials Science Letters, 5 (9) 946-948 doi:10.1007/bf01729284 |
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Plain Text | Iwanaga, H., Yoshiie, T., Katuki, H., Egashira, M., Takeuchi, S. (1986) Defect identification in vapour-grownβ-SiC whiskers. Journal of Materials Science Letters, 5 (9) 946-948 doi:10.1007/bf01729284 |
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In | (1986, September) Journal of Materials Science Letters Vol. 5 (9) Springer Science and Business Media LLC |
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