Reference Type | Journal (article/letter/editorial) |
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Title | TEP measurements on vacuum-evaporated tin oxide thin films |
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Journal | Journal of Materials Science Letters |
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Authors | Siva Kumar, J. | Author |
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Rao, S. Goverdhan | Author |
Rao, U. V. Subba | Author |
Year | 1987 (January) | Volume | 6 |
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Issue | 1 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf01729417Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16409993 | Long-form Identifier | mindat:1:5:16409993:7 |
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GUID | 0 |
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Full Reference | Siva Kumar, J., Rao, S. Goverdhan, Rao, U. V. Subba (1987) TEP measurements on vacuum-evaporated tin oxide thin films. Journal of Materials Science Letters, 6 (1) 25-28 doi:10.1007/bf01729417 |
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Plain Text | Siva Kumar, J., Rao, S. Goverdhan, Rao, U. V. Subba (1987) TEP measurements on vacuum-evaporated tin oxide thin films. Journal of Materials Science Letters, 6 (1) 25-28 doi:10.1007/bf01729417 |
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In | (1987, January) Journal of Materials Science Letters Vol. 6 (1) Springer Science and Business Media LLC |
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