NAM, Sang Cheol, YOON, Young Soo, CHO, Won Il, CHO, Byung Won, YUN, Kyung Suk, CHUN, Hai Soo (2000) Charge/Discharge Performance of Electron Beam Deposited Tin Oxide Thin Film Negative Electrodes. Electrochemistry, 68 (1) 32-37 doi:10.5796/electrochemistry.68.32
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Charge/Discharge Performance of Electron Beam Deposited Tin Oxide Thin Film Negative Electrodes | ||
Journal | Electrochemistry | ||
Authors | NAM, Sang Cheol | Author | |
YOON, Young Soo | Author | ||
CHO, Won Il | Author | ||
CHO, Byung Won | Author | ||
YUN, Kyung Suk | Author | ||
CHUN, Hai Soo | Author | ||
Year | 2000 (January 5) | Volume | 68 |
Issue | 1 | ||
Publisher | The Electrochemical Society of Japan | ||
DOI | doi:10.5796/electrochemistry.68.32Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 16503875 | Long-form Identifier | mindat:1:5:16503875:1 |
GUID | 0 | ||
Full Reference | NAM, Sang Cheol, YOON, Young Soo, CHO, Won Il, CHO, Byung Won, YUN, Kyung Suk, CHUN, Hai Soo (2000) Charge/Discharge Performance of Electron Beam Deposited Tin Oxide Thin Film Negative Electrodes. Electrochemistry, 68 (1) 32-37 doi:10.5796/electrochemistry.68.32 | ||
Plain Text | NAM, Sang Cheol, YOON, Young Soo, CHO, Won Il, CHO, Byung Won, YUN, Kyung Suk, CHUN, Hai Soo (2000) Charge/Discharge Performance of Electron Beam Deposited Tin Oxide Thin Film Negative Electrodes. Electrochemistry, 68 (1) 32-37 doi:10.5796/electrochemistry.68.32 | ||
In | (2000, January) Electrochemistry Vol. 68 (1) The Electrochemical Society of Japan |
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