OKAJIMA, Takeyoshi, OHSAKA, Takeo (2008) 電気化学：測定と解析のてびき 分子機能電極関連分野での応用 １ 高分子膜および自己組織化膜（層）（ＳＡＭ）修飾電極. Electrochemistry, 76 (6) 434-440 doi:10.5796/electrochemistry.76.434
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | 電気化学：測定と解析のてびき 分子機能電極関連分野での応用 １ 高分子膜および自己組織化膜（層）（ＳＡＭ）修飾電極 | ||
| Journal | Electrochemistry | ||
| Authors | OKAJIMA, Takeyoshi | Author | |
| OHSAKA, Takeo | Author | ||
| Year | 2008 | Volume | 76 |
| Issue | 6 | ||
| Publisher | The Electrochemical Society of Japan | ||
| DOI | doi:10.5796/electrochemistry.76.434Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 16505810 | Long-form Identifier | mindat:1:5:16505810:0 |
| GUID | 0 | ||
| Full Reference | OKAJIMA, Takeyoshi, OHSAKA, Takeo (2008) 電気化学：測定と解析のてびき 分子機能電極関連分野での応用 １ 高分子膜および自己組織化膜（層）（ＳＡＭ）修飾電極. Electrochemistry, 76 (6) 434-440 doi:10.5796/electrochemistry.76.434 | ||
| Plain Text | OKAJIMA, Takeyoshi, OHSAKA, Takeo (2008) 電気化学：測定と解析のてびき 分子機能電極関連分野での応用 １ 高分子膜および自己組織化膜（層）（ＳＡＭ）修飾電極. Electrochemistry, 76 (6) 434-440 doi:10.5796/electrochemistry.76.434 | ||
| In | (2008) Electrochemistry Vol. 76 (6) The Electrochemical Society of Japan | ||
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