LIN, Chuen-Chang, LIN, Peng-Yu (2011) Capacitance Measurements of MnOX Films Deposited by Reactive Sputtering of a Mn Target. Electrochemistry, 79 (6) 458-463 doi:10.5796/electrochemistry.79.458
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Capacitance Measurements of MnOX Films Deposited by Reactive Sputtering of a Mn Target | ||
Journal | Electrochemistry | ||
Authors | LIN, Chuen-Chang | Author | |
LIN, Peng-Yu | Author | ||
Year | 2011 | Volume | 79 |
Issue | 6 | ||
Publisher | The Electrochemical Society of Japan | ||
DOI | doi:10.5796/electrochemistry.79.458Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 16506516 | Long-form Identifier | mindat:1:5:16506516:0 |
GUID | 0 | ||
Full Reference | LIN, Chuen-Chang, LIN, Peng-Yu (2011) Capacitance Measurements of MnOX Films Deposited by Reactive Sputtering of a Mn Target. Electrochemistry, 79 (6) 458-463 doi:10.5796/electrochemistry.79.458 | ||
Plain Text | LIN, Chuen-Chang, LIN, Peng-Yu (2011) Capacitance Measurements of MnOX Films Deposited by Reactive Sputtering of a Mn Target. Electrochemistry, 79 (6) 458-463 doi:10.5796/electrochemistry.79.458 | ||
In | (2011) Electrochemistry Vol. 79 (6) The Electrochemical Society of Japan |
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