Reference Type | Journal (article/letter/editorial) |
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Title | Pseudo depth profiling by ESCA and X-ray microanalysis: An application to chemical dealumination of Y-zeolites |
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Journal | Zeolites |
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Authors | Ness, J.N. | Author |
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Joyner, D.J. | Author |
Chapple, A.P. | Author |
Year | 1989 (May) | Volume | 9 |
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Issue | 3 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0144-2449(89)90034-1Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16578844 | Long-form Identifier | mindat:1:5:16578844:1 |
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GUID | 0 |
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Full Reference | Ness, J.N., Joyner, D.J., Chapple, A.P. (1989) Pseudo depth profiling by ESCA and X-ray microanalysis: An application to chemical dealumination of Y-zeolites. Zeolites, 9 (3) 250-252 doi:10.1016/0144-2449(89)90034-1 |
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Plain Text | Ness, J.N., Joyner, D.J., Chapple, A.P. (1989) Pseudo depth profiling by ESCA and X-ray microanalysis: An application to chemical dealumination of Y-zeolites. Zeolites, 9 (3) 250-252 doi:10.1016/0144-2449(89)90034-1 |
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In | (1989, May) Zeolites Vol. 9 (3) Elsevier BV |
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