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Kamal, Surya, Hailstone, Richard K (2023) Need for Wavefront Sensing in Scanning Electron Microscopy. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 491-492 doi:10.1093/micmic/ozad067.233

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Reference TypeJournal (article/letter/editorial)
TitleNeed for Wavefront Sensing in Scanning Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsKamal, SuryaAuthor
Hailstone, Richard KAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.233Search in ResearchGate
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Mindat Ref. ID16636738Long-form Identifiermindat:1:5:16636738:6
GUID0
Full ReferenceKamal, Surya, Hailstone, Richard K (2023) Need for Wavefront Sensing in Scanning Electron Microscopy. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 491-492 doi:10.1093/micmic/ozad067.233
Plain TextKamal, Surya, Hailstone, Richard K (2023) Need for Wavefront Sensing in Scanning Electron Microscopy. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 491-492 doi:10.1093/micmic/ozad067.233
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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