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Allen, Frances I (2023) FIB Milling with Alternative Beams for Microscopy and Microanalysis. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 501-502 doi:10.1093/micmic/ozad067.238

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Reference TypeJournal (article/letter/editorial)
TitleFIB Milling with Alternative Beams for Microscopy and Microanalysis
JournalMicroscopy and Microanalysis
AuthorsAllen, Frances IAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.238Search in ResearchGate
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Mindat Ref. ID16637112Long-form Identifiermindat:1:5:16637112:3
GUID0
Full ReferenceAllen, Frances I (2023) FIB Milling with Alternative Beams for Microscopy and Microanalysis. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 501-502 doi:10.1093/micmic/ozad067.238
Plain TextAllen, Frances I (2023) FIB Milling with Alternative Beams for Microscopy and Microanalysis. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 501-502 doi:10.1093/micmic/ozad067.238
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Zhang, Minghao (2023) Three-dimensional Imaging and Interface Analysis of Battery Materials via Plasma FIB-SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 538 doi:10.1093/micmic/ozad067.253
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Kim, Daewon, Getachew, Bezawit A, Han, Yimo (2023) Generating Nanometer-sized Polymer Wires with SEM/FIB Instrumentation. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 543-544 doi:10.1093/micmic/ozad067.256
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