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Bonifacio, C S, Li, R, Nowakowski, P, Ray, M L, Fischione, P (2023) Artifact-Free Preparation of Plan View TEM Specimens and Its Application to MRAM Devices. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 105-106 doi:10.1093/micmic/ozad067.045

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Reference TypeJournal (article/letter/editorial)
TitleArtifact-Free Preparation of Plan View TEM Specimens and Its Application to MRAM Devices
JournalMicroscopy and Microanalysis
AuthorsBonifacio, C SAuthor
Li, RAuthor
Nowakowski, PAuthor
Ray, M LAuthor
Fischione, PAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.045Search in ResearchGate
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Mindat Ref. ID16637534Long-form Identifiermindat:1:5:16637534:3
GUID0
Full ReferenceBonifacio, C S, Li, R, Nowakowski, P, Ray, M L, Fischione, P (2023) Artifact-Free Preparation of Plan View TEM Specimens and Its Application to MRAM Devices. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 105-106 doi:10.1093/micmic/ozad067.045
Plain TextBonifacio, C S, Li, R, Nowakowski, P, Ray, M L, Fischione, P (2023) Artifact-Free Preparation of Plan View TEM Specimens and Its Application to MRAM Devices. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 105-106 doi:10.1093/micmic/ozad067.045
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Bonifacio, C S, Perea, D E, Nowakowski, P, Ray, M L, Fischione, P (2023) Elucidating Surface Properties by Correlative TEM and APT Studies of Ideal Mg Specimens Prepared Under Controlled Environments. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2073-2074 doi:10.1093/micmic/ozad067.1073
Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2075-2076 doi:10.1093/micmic/ozad067.1074
Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Improved Sample Preparation Technique for Transmission Kikuchi Diffraction (TKD) Analyses Allows Large Area Data Acquisition. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 134-135 doi:10.1093/micmic/ozad067.060
Goettler, D, Zhang, M (2023) Three-In-One Plan-View TEM Sample Preparation for 3D NAND. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 556-557 doi:10.1093/micmic/ozad067.264
Bonifacio, C S, Hubbard, W, Li, R, Ray, M L, Fischione, P (2024) TEM Specimen Preparation for STEM-EBIC Analysis of Advanced Semiconductor Devices. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.066
Bonifacio, C S, Nowakowski, P, Ray, M L, Fischione, P E (2024) Latest Developments in Post-FIB Concentrated Ar Ion Beam Milling of TEM Specimens with Large Electron-transparent Areas. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.1091
Strader, Thomas E, August, Benjamin K, Hsia, Ru-ching (2023) Robotic Preparation of Tissue Specimens for TEM and Volume EM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2089-2090 doi:10.1093/micmic/ozad067.1081
Reisbick, Spencer A, Zhu, Yimei (2023) Artifact Elimination in Ultrafast Electron Microscopy. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 435-436 doi:10.1093/micmic/ozad067.206
Park, Jungwon (2023) Nanoscale Investigation of Energy Storage Systems by In Situ TEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1308 doi:10.1093/micmic/ozad067.669
Nowakowski, P., Bonifacio, C.S., Campin, M.J., Ray, M.L., Fischione, P.E. (2017) Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation. Microscopy and Microanalysis, 23. 300-301 doi:10.1017/s1431927617002185
Goodman, Steven L, Percival, Jeffrey W (2023) Next Generation Automated Programmable Electron Microscopy Preparation. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2062-2063 doi:10.1093/micmic/ozad067.1067
 
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