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Chen, Xi, Gilgenbach, Colin, LeBeau, James M (2023) Characterization of Quantum Emitters and Extended Defects in ZnSe via Multislice Electron Ptychography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 342-343 doi:10.1093/micmic/ozad067.159

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of Quantum Emitters and Extended Defects in ZnSe via Multislice Electron Ptychography
JournalMicroscopy and Microanalysis
AuthorsChen, XiAuthor
Gilgenbach, ColinAuthor
LeBeau, James MAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.159Search in ResearchGate
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Mindat Ref. ID16637580Long-form Identifiermindat:1:5:16637580:0
GUID0
Full ReferenceChen, Xi, Gilgenbach, Colin, LeBeau, James M (2023) Characterization of Quantum Emitters and Extended Defects in ZnSe via Multislice Electron Ptychography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 342-343 doi:10.1093/micmic/ozad067.159
Plain TextChen, Xi, Gilgenbach, Colin, LeBeau, James M (2023) Characterization of Quantum Emitters and Extended Defects in ZnSe via Multislice Electron Ptychography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 342-343 doi:10.1093/micmic/ozad067.159
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Gilgenbach, Colin, Bhat, Aaditya, LeBeau, James (2023) Investigating Qubits in Silicon Carbide Using Multislice Electron Ptychography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1737 doi:10.1093/micmic/ozad067.898
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Zhu, Menglin, Xu, Michael, Gilgenbach, Colin, Denzer, Bridget R, LeBeau, James M (2024) Characterizing the 3D Polar Texture of Ferroelectric Relaxors using Multislice Electron Ptychography. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.550
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