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Qiu, Haonan, Chen, Siyu, Gan, Bei, Wang, Kun, Shi, Huafeng, Shao, Jing, Liu, Ziwei (2023) Few-shot forgery detection via Guided Adversarial Interpolation. Pattern Recognition, 144. Elsevier BV. 109863 doi:10.1016/j.patcog.2023.109863

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Reference TypeJournal (article/letter/editorial)
TitleFew-shot forgery detection via Guided Adversarial Interpolation
JournalPattern Recognition
AuthorsQiu, HaonanAuthor
Chen, SiyuAuthor
Gan, BeiAuthor
Wang, KunAuthor
Shi, HuafengAuthor
Shao, JingAuthor
Liu, ZiweiAuthor
Year2023 (December)Volume144
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2023.109863Search in ResearchGate
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Mindat Ref. ID16647523Long-form Identifiermindat:1:5:16647523:4
GUID0
Full ReferenceQiu, Haonan, Chen, Siyu, Gan, Bei, Wang, Kun, Shi, Huafeng, Shao, Jing, Liu, Ziwei (2023) Few-shot forgery detection via Guided Adversarial Interpolation. Pattern Recognition, 144. Elsevier BV. 109863 doi:10.1016/j.patcog.2023.109863
Plain TextQiu, Haonan, Chen, Siyu, Gan, Bei, Wang, Kun, Shi, Huafeng, Shao, Jing, Liu, Ziwei (2023) Few-shot forgery detection via Guided Adversarial Interpolation. Pattern Recognition, 144. Elsevier BV. 109863 doi:10.1016/j.patcog.2023.109863
In(2023) Pattern Recognition Vol. 144. Elsevier BV

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