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Fleutot, B., Pecquenard, B., Martinez, H., Levasseur, A. (2012) Thorough study of the local structure of LiPON thin films to better understand the influence of a solder-reflow type thermal treatment on their performances. Solid State Ionics, 206. 72-77 doi:10.1016/j.ssi.2011.11.009

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Reference TypeJournal (article/letter/editorial)
TitleThorough study of the local structure of LiPON thin films to better understand the influence of a solder-reflow type thermal treatment on their performances
JournalSolid State Ionics
AuthorsFleutot, B.Author
Pecquenard, B.Author
Martinez, H.Author
Levasseur, A.Author
Year2012 (January)Volume206
PublisherElsevier BV
DOIdoi:10.1016/j.ssi.2011.11.009Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16819104Long-form Identifiermindat:1:5:16819104:0
GUID0
Full ReferenceFleutot, B., Pecquenard, B., Martinez, H., Levasseur, A. (2012) Thorough study of the local structure of LiPON thin films to better understand the influence of a solder-reflow type thermal treatment on their performances. Solid State Ionics, 206. 72-77 doi:10.1016/j.ssi.2011.11.009
Plain TextFleutot, B., Pecquenard, B., Martinez, H., Levasseur, A. (2012) Thorough study of the local structure of LiPON thin films to better understand the influence of a solder-reflow type thermal treatment on their performances. Solid State Ionics, 206. 72-77 doi:10.1016/j.ssi.2011.11.009
In(2012) Solid State Ionics Vol. 206. Elsevier BV

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Fleutot, B., Pecquenard, B., Martinez, H., Letellier, M., Levasseur, A. (2011) Investigation of the local structure of LiPON thin films to better understand the role of nitrogen on their performance. Solid State Ionics, 186 (1) 29-36 doi:10.1016/j.ssi.2011.01.006
Fleutot, B., Pecquenard, B., Martinez, H., Levasseur, A. (2013) Lithium borophosphate thin film electrolyte as an alternative to LiPON for solder-reflow processed lithium-ion microbatteries. Solid State Ionics, 249. 49-55 doi:10.1016/j.ssi.2013.07.009
Hamon, Y., Douard, A., Sabary, F., Marcel, C., Vinatier, P., Pecquenard, B., Levasseur, A. (2006) Influence of sputtering conditions on ionic conductivity of LiPON thin films. Solid State Ionics, 177 (3) 257-261 doi:10.1016/j.ssi.2005.10.021
Gies, A., Pecquenard, B., Benayad, A., Martinez, H., Gonbeau, D., Fuess, H., Levasseur, A. (2005) Effect of total gas and oxygen partial pressure during deposition on the properties of sputtered V2O5 thin films. Solid State Ionics, 176 (17) 1627-1634 doi:10.1016/j.ssi.2005.02.012
Lindic, M.H., Martinez, H., Benayad, A., Pecquenard, B., Vinatier, P., Levasseur, A., Gonbeau, D. (2005) XPS investigations of TiOySz amorphous thin films used as positive electrode in lithium microbatteries. Solid State Ionics, 176 (17) 1529-1537 doi:10.1016/j.ssi.2005.04.007
Martin, L., Martinez, H., Ulldemolins, M., Pecquenard, B., Le Cras, F. (2012) Evolution of the Si electrode/electrolyte interface in lithium batteries characterized by XPS and AFM techniques: The influence of vinylene carbonate additive. Solid State Ionics, 215. 36-44 doi:10.1016/j.ssi.2012.03.042
Martinez, H., Benayad, A., Gonbeau, D., Vinatier, P., Pecquenard, B., Levasseur, A. (2004) Influence of the cation nature of high sulfur content oxysulfide thin films MO S (M=W, Ti) studied by XPS. Applied Surface Science, 236. 377-386 doi:10.1016/j.apsusc.2004.05.010
Benayad, A., Martinez, H., Gies, A., Pecquenard, B., Levasseur, A., Gonbeau, D. (2006) Vanadium pentoxide thin films used as positive electrode in lithium microbatteries: An XPS study during cycling. Journal of Physics and Chemistry of Solids, 67. 1320-1324 doi:10.1016/j.jpcs.2006.01.089
Corbella, C (2003) Influence of the porosity of RF sputtered Ta2O5 thin films on their optical properties for electrochromic applications. Solid State Ionics, 165 (1) 15-22 doi:10.1016/j.ssi.2003.08.018
ROSENSTOCK, Z (2004) Solid state devices based on thin films of Cu2O show a new type of I?V relations. Solid State Ionics, 175 (1) 375-378 doi:10.1016/j.ssi.2004.03.049
MASUNO, A (2004) Epitaxial growth of perovskite-type LaVO3 thin films on various substrates by the PLD method. Solid State Ionics, 172 (1) 275-278 doi:10.1016/j.ssi.2004.02.047
 
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