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Tanaka, M., Liu, Y.F., Kim, S.S., Kagawa, Y. (2008) Delamination toughness of electron beam physical vapor deposition (EB-PVD) Y2O3–ZrO2 thermal barrier coatings by the pushout method: Effect of thermal cycling temperature. Journal of Materials Research, 23 (9) 2382-2392 doi:10.1557/jmr.2008.0288

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Reference TypeJournal (article/letter/editorial)
TitleDelamination toughness of electron beam physical vapor deposition (EB-PVD) Y2O3–ZrO2 thermal barrier coatings by the pushout method: Effect of thermal cycling temperature
JournalJournal of Materials Research
AuthorsTanaka, M.Author
Liu, Y.F.Author
Kim, S.S.Author
Kagawa, Y.Author
Year2008 (September)Volume23
Issue9
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1557/jmr.2008.0288Search in ResearchGate
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Mindat Ref. ID17103796Long-form Identifiermindat:1:5:17103796:0
GUID0
Full ReferenceTanaka, M., Liu, Y.F., Kim, S.S., Kagawa, Y. (2008) Delamination toughness of electron beam physical vapor deposition (EB-PVD) Y2O3–ZrO2 thermal barrier coatings by the pushout method: Effect of thermal cycling temperature. Journal of Materials Research, 23 (9) 2382-2392 doi:10.1557/jmr.2008.0288
Plain TextTanaka, M., Liu, Y.F., Kim, S.S., Kagawa, Y. (2008) Delamination toughness of electron beam physical vapor deposition (EB-PVD) Y2O3–ZrO2 thermal barrier coatings by the pushout method: Effect of thermal cycling temperature. Journal of Materials Research, 23 (9) 2382-2392 doi:10.1557/jmr.2008.0288
In(2008, September) Journal of Materials Research Vol. 23 (9) Springer Science and Business Media LLC


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