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Fernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163

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Reference TypeJournal (article/letter/editorial)
TitleLayer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection
JournalApplied Sciences
AuthorsFernández, AlejandroAuthor
Blanco, DavidAuthor
Álvarez, Braulio J.Author
Fernández, PedroAuthor
Zapico, PabloAuthor
Valiño, GonzaloAuthor
Year2024 (July 15)Volume14
Page(s)6163Issue14
PublisherMDPI AG
DOIdoi:10.3390/app14146163Search in ResearchGate
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Mindat Ref. ID17506441Long-form Identifiermindat:1:5:17506441:2
GUID0
Full ReferenceFernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163
Plain TextFernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163
In(2024, July) Applied Sciences Vol. 14 (14) MDPI AG


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