Fernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection | ||
Journal | Applied Sciences | ||
Authors | Fernández, Alejandro | Author | |
Blanco, David | Author | ||
Álvarez, Braulio J. | Author | ||
Fernández, Pedro | Author | ||
Zapico, Pablo | Author | ||
Valiño, Gonzalo | Author | ||
Year | 2024 (July 15) | Volume | 14 |
Page(s) | 6163 | Issue | 14 |
Publisher | MDPI AG | ||
DOI | doi:10.3390/app14146163Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 17506441 | Long-form Identifier | mindat:1:5:17506441:2 |
GUID | 0 | ||
Full Reference | Fernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163 | ||
Plain Text | Fernández, Alejandro, Blanco, David, Álvarez, Braulio J., Fernández, Pedro, Zapico, Pablo, Valiño, Gonzalo (2024) Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection. Applied Sciences, 14 (14) 6163 doi:10.3390/app14146163 | ||
In | (2024, July) Applied Sciences Vol. 14 (14) MDPI AG |
See Also
These are possibly similar items as determined by title/reference text matching only.