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Pradhan, Arushi, Thimons, Luke A., Lavrik, Nickolay, Kravchenko, Ivan I., Jacobs, Tevis D. B. (2024) Tuning Surface Adhesion Using Grayscale Electron-beam Lithography. Langmuir, 40 (28) 14257-14265 doi:10.1021/acs.langmuir.4c00669

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Reference TypeJournal (article/letter/editorial)
TitleTuning Surface Adhesion Using Grayscale Electron-beam Lithography
JournalLangmuir
AuthorsPradhan, ArushiAuthor
Thimons, Luke A.Author
Lavrik, NickolayAuthor
Kravchenko, Ivan I.Author
Jacobs, Tevis D. B.Author
Year2024 (July 16)Volume40
Page(s)14257-14265Issue28
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/acs.langmuir.4c00669Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID17509629Long-form Identifiermindat:1:5:17509629:1
GUID0
Full ReferencePradhan, Arushi, Thimons, Luke A., Lavrik, Nickolay, Kravchenko, Ivan I., Jacobs, Tevis D. B. (2024) Tuning Surface Adhesion Using Grayscale Electron-beam Lithography. Langmuir, 40 (28) 14257-14265 doi:10.1021/acs.langmuir.4c00669
Plain TextPradhan, Arushi, Thimons, Luke A., Lavrik, Nickolay, Kravchenko, Ivan I., Jacobs, Tevis D. B. (2024) Tuning Surface Adhesion Using Grayscale Electron-beam Lithography. Langmuir, 40 (28) 14257-14265 doi:10.1021/acs.langmuir.4c00669
In(2024, July) Langmuir Vol. 40 (28) American Chemical Society (ACS)

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