Reference Type | Journal (article/letter/editorial) |
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Title | Strain engineering for the interfacial thermal resistance of few-layer graphene with porous defects |
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Journal | Journal of Applied Physics |
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Authors | Zhang, Bin | Author |
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Xue, Yixuan | Author |
Jiang, Jin-Wu | Author |
Year | 2024 (November 7) | Volume | 136 |
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Issue | 17 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/5.0232097Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 17687536 | Long-form Identifier | mindat:1:5:17687536:9 |
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GUID | 0 |
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Full Reference | Zhang, Bin, Xue, Yixuan, Jiang, Jin-Wu (2024) Strain engineering for the interfacial thermal resistance of few-layer graphene with porous defects. Journal of Applied Physics, 136 (17). doi:10.1063/5.0232097 |
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Plain Text | Zhang, Bin, Xue, Yixuan, Jiang, Jin-Wu (2024) Strain engineering for the interfacial thermal resistance of few-layer graphene with porous defects. Journal of Applied Physics, 136 (17). doi:10.1063/5.0232097 |
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In | (2024, November) Journal of Applied Physics Vol. 136 (17). AIP Publishing |
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