Isshiki, Yuji, Fujii, Shintaro, Nishino, Tomoaki, Kiguchi, Manabu (2018) Fluctuation in Interface and Electronic Structure of Single-Molecule Junctions Investigated by Current versus Bias Voltage Characteristics. Journal Of The American Chemical Society, 140 (10) 3760-3767 doi:10.1021/jacs.7b13694
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Fluctuation in Interface and Electronic Structure of Single-Molecule Junctions Investigated by Current versus Bias Voltage Characteristics | ||
Journal | Journal Of The American Chemical Society | ||
Authors | Isshiki, Yuji | Author | |
Fujii, Shintaro | Author | ||
Nishino, Tomoaki | Author | ||
Kiguchi, Manabu | Author | ||
Year | 2018 (March 14) | Volume | 140 |
Issue | 10 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/jacs.7b13694Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 1796185 | Long-form Identifier | mindat:1:5:1796185:5 |
GUID | 0 | ||
Full Reference | Isshiki, Yuji, Fujii, Shintaro, Nishino, Tomoaki, Kiguchi, Manabu (2018) Fluctuation in Interface and Electronic Structure of Single-Molecule Junctions Investigated by Current versus Bias Voltage Characteristics. Journal Of The American Chemical Society, 140 (10) 3760-3767 doi:10.1021/jacs.7b13694 | ||
Plain Text | Isshiki, Yuji, Fujii, Shintaro, Nishino, Tomoaki, Kiguchi, Manabu (2018) Fluctuation in Interface and Electronic Structure of Single-Molecule Junctions Investigated by Current versus Bias Voltage Characteristics. Journal Of The American Chemical Society, 140 (10) 3760-3767 doi:10.1021/jacs.7b13694 | ||
In | (2018, March) Journal Of The American Chemical Society Vol. 140 (10) American Chemical Society (ACS) |
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